SUMMARY

Experienced professional with over * years of working in a lab/organization.

Over 5 years as a Senior FIB Technician at a service lab doing sample prep on IC/devices.

* ***** ** ******* ***lysis finding root cause of head/media failure.

Adept at utilizing critical problem-solving skills and keen attention to detail to produce effective output.

Ability to ramp quickly on new technologies/equipment.

EQUIPMENTS USED

FIB (Altura 855 Helios 400/ 450/ 460 Helios G3)

EDX (Noran Oxford Inca)

TEM (JEOL 100cx TEM)

DIGITAL INSTRUMENTS (AFM, Candela, SmartScope)

SEM (SEM Hitachi 4700/ 4800)

COATERS (Denton Sputter Coater, ALD)

PROFESSIONAL EXPERIENCE

Nanolab Technologies (2013 – Current)

Senior FIB technician, Team Lead

oSupport customer requests for STEM/SEM/TEM/EDS analysis of silicon wafers and various devices by means of dual beam FIB sample preparation (electron and ion beam target isolation, bulk cut, polish and lift out technique)

oDual Beam FIB polishing of devices down to < 20nm thickness; including high aspect ratio devices; i.e. > 5um VNAND devices and > 50um TSV device

oSample preparation involving material coating via sputter coating and Atomic Layer Deposition

oCross sectional/Top down SEM imaging and EDS analysis of devices to detect defects and provide data interpretation such as device measurements and material characterization

oManaging queue and workflow of up to 200 sample submissions on daily basis in order to support fast turn around of data to customers ( >12 hr TAT)

oManaged team of 10 personnel responsibilities include scheduling, assigning tasks and projects, monthly/quarterly performance reviews and provide guidance/support ranging from equipment and sample preparation issues to achieving personal work-based goals

Western Digital (2011 - 2013)

Jr Failure Analysis Engineer

oInspected parts and components for particles, debris, scratches

oAnalyzed findings by means of Optical Micjroscope, Candela, Smart Scope, SEM, EDX

oCollected findings and data of hard disk drives in clean room environment

oOptical Microscopes, SEM, Candela

oComposed all findings and data onto PowerPoint report to conclude root cause of failure

oDelivered accurate and timely failure analysis, identified root causes of failures

oIdentified various root causes of disk defects by collecting data

EDUCATION

San Joaquin Delta College

Materials Electron Microscopy

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