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Data Design resume in West Lafayette, IN - December 2012
Gate Leakage vs. NBTI in Plasma Nitrided Oxides: Characterization, Physical
Principles, and Optimization
*1A.E. Islam, 2G. Gupta, 2S. Mahapatra, 3A.T. Krishnan, 4K. Ahmed, 4F. Nouri, 5A. Oates, 1M.A. Alam
*Email: *******@******.***, Phone: 765-***-****, Fax: 765-***-****
1
Electrical and...
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