Sr. Manufacturing Test Engineer
Resume:
David W. Post
**** **** ****** **** ***- ***-**44
Ellicott City, MD 21042 ********@*****.***
___________________________________________________________________________
Qualification Summary
Expert HP3070 ICT developer and expert in schematic Design for Testability (DFT) and CAD access reviews. ATE Functional Test Development in multiple test languages and platforms; Experienced in ICT Development/Support on multiple test platforms; Multiple product line familiarization, specification detail, bidding, project management, diagnostics, training and presentations. Hold security clearance at Secret level (inactive).
Software, Training, and Skill Base
NI LABView
Corelis –BSCAN
Functional ATE Development
Schematic DFT Expert
uController Code
VI and AWK Scripting
HP3070 ICT Expert
GenRad 228x Development
UNIX/PC Controllers
Design Of Experiments
Statistical Process Control
Proposal Writing
PCAD/D2B CAD Translation
Education and Additional Training
BSEE University of Minnesota, 1982
Advanced Boundary Scan for HP3070
Corelis – Stand Alone BSCAN development
LABView Basics HPVEE Basics
System Administration for HPUX
C Programming,
C# Exposure
Basic User Training for HP3070
Basic User Training for GenRad 228x
Work History
2009-Present iDirect, Herndon, VA
Sr. Manufacturing Test Engineer
Defined and Deployed ATE and ICT test fixtures for RF satellite communications equipment.
• Defined PXIe National Instruments test station for use with Corelis BSCAN, incorporating Virginia Panel Fixture Interface.
• Developed and deployed functional test for 20 slot Hub Chassis including RF sweep and digital card control.
• Deployed Corelis BSCAN test for new satellite line card.
• Performed schematic DFT reviews and access evaluations for NPI (New Product Introduction).
• Defined and deployed spring pin based ATE for digitally controlled I2C Mux Card.
Work History David W. Post (continued)
2008-09 Logic PD – Product Development, Eden Prairie, MN
Test Engineer III
Defined and maintained ICT testing for a $20 Million Aerospace customer account.
• Defined SOW for turnkey ICT Fixture/Software development.
• Performed schematic DFT reviews for new and existing customers.
• Provided work direction for junior engineers.
• Created Access data base for AS9100 software configuration management control.
• Implemented Bead Probe technology in cooperation with customer, PCB designer and
Internal manufacturing.
2007 Becton, Dickinson Company– Diagnostics, Baltimore, MD
Test Engineer/Contract
Responsible for development of GenRad ICT test fixtures for a new medical diagnostic product.
• Defined detailed SOW for a turnkey GenRad 228x ICT fixture/software development.
• Installed ICT fixtures and stabilized programs for production release.
• Documented coverage vs. SOW.
• Upgraded test platform from Windows NT to Windows XP and recommended upgrade with Asset ScanWorks for BSCAN testing and ISP programming of CPLD’s and Micro Controllers.
2006-07 The Test Connection Inc., Baltimore, MD
Sr. Test Engineer/Contract
Responsible for development of HP3070 ICT test fixtures in a contract engineer environment with software/hardware debug and installation into the manufacturing facility and customer support. Responsible for maintaining: system hardware and software backups. Responsible for developing a circuit card to demo with ICT/ Functional dual level test fixture using LABView.
• Designed demo circuit card using PCAD for PWB models and schematic capture.
• Created functional test specification and I/O mux. requirements for the demo circuit card.
Work History David W. Post (continued)
1998-2006 Plexus Corp., Neenah, WI
Design Engineer II
Responsible for development of HP3070 ICT test fixtures in a contract engineer environment with software/hardware debug and installation into the manufacturing facility. Developments included: Advanced Boundary Scan, ISP Programming, serial/parallel/EPROM programming, CLPD programming, MAC Address programming, USERCODE, multiple logic families, & differential I/O, functional cluster and node testing.
• Performed schematic DFT reviews for internal and OEM customer products.
• Performed CAD access analysis for probe reduction strategies.
• Debug programs for six sigma equivalent stability.
• Developed AWK scripts reducing ICT development cycle and debug times.
• Projects ranged from 100 nodes to 4500 nodes; more than 80 developments.
• Product Types: Computer Mother boards, Device Pick and Place Equipment, Medical Equipment, Telecom, Light Industrial, Military.
1997-98 Compaq Computer Corp., Houston, TX
Test Engineer
Responsible for developing high volume GenRad ICT fixtures, with installation into US and foreign facilities.
• Implemented MAC address programming on the GenRad 228x ICT platform, saving $250K/yr in device storage costs.
• Product Types: mother boards for laptop computers and peripherals.
1995-97 California Microwave/Microwave Network Systems,
Stafford, TX
Sr. Test Engineer
Responsible for developing HP3070 ICT and ICT support for existing fixtures on HP3070 and Teradyne 1860 test platforms in manufacturing environment.
• Performed system maintenance on HP3070, Teradyne 1860 ICT testers.
• Developed C program and fixture to test high frequency programmable local oscillator.
• Product Types: telephone multiplexing and RF transmitting/receiving equipment.
Work History David W. Post (continued)
1987-93 Alliant Techsystems/Honeywell, Hopkins, MN
Senior Production Engineer
Responsible for developing ICT and ATE functional test equipment and fixtures for military circuit boards and subassemblies.
• Held a security clearance at Secret level.
• Supervised work assignments for three engineers.
• Created ATE functional tests for digital and hybrid circuit cards; to include: flow charting, programming, fixture design, documentation, troubleshooting, adapter calibration software and interface hardware and training.
• Developed ATE Functional Test for sub-assembly level display product using HP Basic.
• Developed ATE functional tester for high frequency countermeasure system.
• Product Types: Military Fire Control Systems, High Current Counter Measure System, High Frequency Radar Equipment
References Available Upon Request
Contact this candidate