Engineer Manager
Resume:
Dudley B. Hiller
Siler City, North Carolina 27344
Cell: 303-***-****, Home 919-***-****
Email: *************@***.***
Qualifications
• Programming Proficiency
o C/C++, Basic, Pascal, GR, HPL…
o Assembly Languages A166, X86, Atmel-AVR, PIC-Micro, I8051, MC680X…
• In-Circuit and Functional Test Development
o Test Fixture Development
o Test Program Development with Teradyne TS12X, GR228X, GR227X, HP3070 and HP306X
o Test Model Development for Microprocessors, Microcontrollers, Interface Controllers, Flash, SRAMs, SDRAMs, DDRs, Disk Drive Electronics, Mixed Signal Devices and many more.
o Boundary-Scan, BSDL, JTAG State Machine
o In-System Programming of Parallel, Serial, Microcontroller-Embedded Flash and FPGAs
o Micro code that runs interactively with ICT
• Hardware Design
o Experience designing Microprocessor and Microcontroller based circuitry
o Design for Testability (DFT), Test Plans and Test Strategy
• CAD Experience
o AutoCAD, Or CAD, Cadence Allegro, CB Test, D2B
• Failure Analysis
o Debug of complex digital and analog circuitry to the component or pin-level
• PC Skills
o Word, Excel, Power Point, HTML…
Experience
Uwharrie Test Solutions LLC, Siler City, North Carolina July 2010 - Present
Position: Owner / Consultant http://www.uwharrietest.com/
• Home business that develops custom software for Teradyne TestStation and GenRad 228X.
• Private contractor for Aspen Test Engineering Inc.
• Member of Teradyne Support Network
Aspen Test Engineering, Inc. Lafayette, Colorado (Rehired) August 2006 – July 2010
Position: Senior Project Engineer
Accomplishments:
• Custom ICT and/or Functional Test Programs for about 20 PCBAs per year.
• Vector based Test Models for VLSI and Hybrid Test Models for Mixed Signal Devices.
Go to http://www.aspentest.com/, I am the originator of most everything related to Advanced Models and In-System Programming.
• On-site installation at manufacturing facilities.
• Client support and training.
• Developed In-System Programming Models for Atmel-AVR, STM32, ST10, Infineon XC228X, PIC Micro 12/16/18, MSP430, Intel Strata Flash, EEPROMS and NAND Flash.
• The ST10 programming solution provided $760K in documented savings in production cost to one client over a 30-month period.
• The NAND flash programming solution proved the Wikipedia on-line Encyclopedia to be incorrect in its statement that NAND flash cannot be reliably programmed by an in-circuit tester.
Go to this site, see: Limitations http://en.wikipedia.org/wiki/Bed_of_nails_tester - Bed_of_nails_tester
• The XC228X flash programming solution beat the programming time of SofTec FlashRunnertm by 49 seconds, saving the industry $0.83 per device.
Maxtor Corporation, Longmont, Colorado May 1994 - July 2006
Positions: Senior Test Engineer - Staff Test Engineer - Senior Staff Test Engineer
Accomplishments:
• Provided the in-circuit test programs and test fixture designs for all of Maxtor’s products from 1994-2006. This included Disk Drive Electronics, Consumer Products, Network Attached Storage and Factory Test Equipment.
• Design for Testability review of PCBAs (Electrical and Mechanical). Enforced the changes!
• Developed an in-house fixture and programming process that provided a working fixture and a debugged program in three working days from CAD release. About four hours after the first assembled units existed.
• Technical support to offshore contract manufacturers. On-site support for New Product Introduction (NPI). Supported companies included Celestica/IMS (sites: Hong Kong, Dong Guan and Suzhow China, Laem Chabang Thailand and Penang Malaysia) and JHT (sites: Singapore, Johor Bahru Malaysia and Suzhow China) Filled 27 pages in passport.
• Developed and implemented many emergency functional tests at ICT for failing devices. Saved Maxtor from expensive, part recalls and/or NPI delays.
• Provided In-System Programming solutions at ICT for serial flash, parallel flash and Microcontroller-embedded flash. Consolidated all flash programming stations into ICT.
• Failure analysis of ICT rejected devices.
• Developed and implemented data collection systems and device lot-code tracking routines.
• Developed C/C++ translation tools to convert simulation vectors into ICT language.
• Design of specialized fixture electronics.
Reason for Departure: Facility closed due to acquisition by Seagate
Aspen Test Engineering, Inc. Boulder, Colorado Departed May 1994
Position: Senior Test Engineer
Reason for Departure: Opportunity
NBI Corporation, Boulder, Colorado
Position: Electronic Technician I - II - III - Test Programmer - Associate Test Engineer - Test Engineer
Reason for Departure: Facility closed
Academics
University of Colorado, Boulder, Colorado
• Electrical and Computer Engineering Department, Job specific courses
GenRad Customer Training Center, Framingham, Massachusetts
• GenRad 228X Advanced Programming Techniques
• Customer training program for GenRad 227X In-Circuit Test Systems
Hewlett Packard Loveland Instrument Division, Loveland Colorado
• Customer training program for HP3060 Board Test Systems
Community College of Denver, Northglenn, Colorado
• Computer Technology Department, Job specific courses
Control Data Institute, Independence, Ohio
• Graduated from the Computer Technology Program
References
Name Former Position or Relationship Company Home
Bill Hass Sr. Manager of Supplier Quality Engineering Maxtor 303-***-****
Dave Jaeger Manager of PCBA Test Maxtor 970-***-****
Joann Vigil Director of Engineering Services Maxtor 303-***-****
Claud Blevins Manager of Electrical Design Maxtor 303-***-****
Jim Fogelburg Manager of Test Engineering NBI 303-***-****
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