JOANNA GRACE V. DELA CRUZ
Address: #****F La Consolacion St., Guadalupe Nuevo, Makati City, Philippines
Email: ***********.********@*****.***
Contact Number #: (63-915*******
CAREER AIM:
To pursue a dynamic career in a competitive organization that provides continuous professional growth and personal development.
QUALITIES:
• Knowledgeable in different electrical and physical failure analysis and understanding failure mechanism
• Experienced in IC failure analysis and fault localization techniques such as OBIRCH, LEM, XIVA, LC and Microprobing Analysis
• Handled various hi-end and powerful equipment for fault die isolation techniques
• Five (5) years of experienced as Reliability and FA Analyst and one (1) year as Product/Failure Analysis Engineer in a semiconductor company
• Extensive experience in performing Package Failure Analysis/Construction Analysis on a wide range of semi-conductor parts and products (BGA’s, Laminates, Lead Frames, Hermetic, Flip Chip, etc).
• Knowledgeable in handling analytical equipments (both destructive and non-destructive) such as Scanning Electron Microscope, Scanning Acoustic Tomography, X-ray, Curve Tracer, TDR, Automatic Chemical Decapsulator, Polisher, Laser Decapsulator, etc…
• Computer literate, adequate in using MS Office and other programs.
• Willing to work overtime and in any places. Easy to be with. Flexible. Fast learner and willing to be train. Can work in minimum supervision.
WORK EXPIRIENCES:
Company: Analog Devices Inc. – Gen. Trias Cavite
Gateway Business Park Javalera, Gen. Trias Cavite, Philippines
Position: Product/Failure Analysis Engineer
Department: World Wide Product Analysis
Date: March 2010 to Present
Job Descriptions:
• Performs extensive physical and electrical characterization on the device to verify failure mode
• Work on die level analysis to further investigate the device’s root cause of failure
• Knowledgeable in handling different failure analytical equipments
• Generate Failure Analysis Report that will illustrate and explain cause of failure on the device
• Communicates with the customer regarding their complaint on the parts they submitted to have more information that will help during the failure investigation
Company: AMKOR Technology Philippines – Site 3
#119 North Science Ave. LTAI Sta. Rosa, Laguna, Philippines
Position: Reliability Operation Technician / Construction and Failure Analyst
Station: Reliability and Failure Analysis Laboratory
Date: May 2005 to March 2010
Responsibilities:
As Reliability Operation Analyst: (May 2005 to April 2006)
• Performs Reliability Procedure for different types of packages.
• Performs “Force Convection Reflow” profiling
• Performs “Bias testing”, “leakage testing”, and “4pt bond resistance testing”.
• Performs C-Scanning Acoustic Microscopy on different types of package.
As Construction Analyst: (April 2006 to July 2007)
• Performs “Construction Analysis” on different semiconductor packages (BGA’s, Laminates, Lead Frames, etc).
• Communicates and generates formal Construction Analysis Report based on the gathered data for internal and external package/device monitoring.
• Conduct training of “Package Construction Analysis” to Rel/FA personnel.
As Failure Analyst: (July 2007 to March 2010)
• Performs Failure Analysis in all in-line failures, test failures, and customer returns issues.
• Performs metallurgical procedures on various packages.
• Communicates and generates formal Failure Analysis Report based on the gathered data for both internal and external customers.
• Manage laboratory consumables and chemicals.
MACHINE / EQUIPMENT EXPERTISE:
Scanning Electron Microscopy (SEM) Hitachi/Leo Supra 45
Chemical Decapsulator B&G/Nisene
Laser Decapsulator Sesame 1000
Variable Grinder/Polishing Leco/Ecomet
Real Time X-Ray Fein Focus
Curved Tracer Tektronix
O/S Tester UTI / Exatron / Huntron
Profiler Datapaq
BallShear/WirePull Tester Dage
Reflow (Force Convection) Vitronics
Time Domain Reflectrometry Tektronix
LEM/LSIM Equipment QFI
OBIRCH Phemos 1000
Liquid Crystal Analysis Hypervision
OTHER MACHINE / EQUIPMENT HANDLED:
High Temp Storage Espec
Temp Humidity Chamber Espec/Weiss
Temperature Cycle Espec/Weiss
Thermal Shock Envron
HAST Espec/Hirayama
Pressure Cooker Test Hirayama
Measuring Scope Olympus
Hi/Low Power Scope Hirox/Olympus
Low Speed Saw Buehler/Leco
Scanning Acoustic Tomography Sonoscan/Sonix
MACHINE / EQUIPMENT FAMILIAR WITH:
Fourier Transform Infra-red (FTIR) Nicolet
Focused-Ion Beam (FIB)
EDUCATIONAL ATTAINMENT:
Electronics and Communication Engineering
2006-2009 Technological University of the Philippines Taguig, Metro Manila
Electronics Engineering Technology – DOST SIE Scholarship Awardee
2002-2005 Technological University of the Philippines Ermita, Metro Manila
Secondary
1998-2002 Arellano University – Jose Abad Santos High School Buendia, Pasay City
REFERENCES:
Excellent references are available upon request.