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Software Engineer System

Location:
Berkeley, CA
Posted:
November 07, 2012

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Resume:

Allan Sagle

**** ********* *****

Berkeley Ca, **702

Phone: 510-***-****

e-mail: *****@*******.***

fax : 510-***-****

Education

**** **.* ** ******* from the University of California at Davis

Thesis: The Absolute Measurement of Neutron Polarization in the 5 Nucleon

Reaction

Post doctoral research at the Lawrence Berkeley Laboratory 1974 - 1982

Experiments on the medium energy accelerator, the Bevetron

Work Experience

Berkeley Engineering and Research Nov 2006 present

Designed, built and tested prototype non-stick electrosurgical forceps. Designed

an IR system to detect the spatial and intensity distribution of carbon monoxide

from a flame for oil refineries

4-Dimaging May 2006 2007

Calibrated and tested 3-dimensional imaging scanners that use structured light

techniques. Updated a patent to include single shot techniques that eliminates

blurring due to motion

ETEC: 1982- 2006

2004 Performed experiments to isolate the dose error due to shot noise by measuring

shot noise dose and CD uniformity on a medium resolution machine at ETEC and

a high resolution machine at LBNL. These latter experiments showed that shot

noise could be reduced to manageable levels by using a mask writer with a small

beam blur. Incorporated shot noise effects in the error budget for the next

generation e-beam mask-maker

2002 Started working on the raster shaped beam product

Constructed an error budget

Tested the error budget. Correlated beam on edge noise with lithography CD

uniformity by injecting 60 hz and white noise into the tool

Developed a technique to measure the isofocal dose using overlay shifts

1997 Performed system engineering for the raster multi-beam project which included

the development of

Error budgets

Throughput models

Writing strategies

Study of system tradeoffs

1987 Software supervisor for the vector shaped beam tool called AEBLE

Up to 8 engineers

Developed software for calibrations, writing, registration, and metrology

Shipped releases to 12 customers

Implemented engineering change orders

1982 Control software engineer. I developed software for:

electron column setup

and shape calibration

Publications:

Exploring the fundamental limit of CD control: a model for shot noise in

lithography

Ming L. Yu, Allan Sagle, and Benny Buller

Proceedings of SPIE -- Volume 5751, May 2005, pp. 687-698

Exploring the fundamental limit of CD control: a measurement of shot noise

induced CDU in e-beam lithography

Ming L. Yu, Allan Sagle, and Benny Buller

Proceedings of SPIE -- Volume 5835, June 2005, pp. 105-114

Exploring the fundamental limit of CD control: shot noise and CD uniformity

improvement through resist thickness

Ming L. Yu, Allan Sagle, and Benny Buller

Proceedings of SPIE -- Volume 5853, June 2005, pp. 42-51

Raster Shaped Beam Pattern Generation for 70 nm Photomask Production

Thomas H. Newman et al.

Proc. SPIE Int. Soc. Opt. Eng. 4889, 168 (2002)

Prototype raster multibeam lithography tool

S. T. Coyle, D. Holmgren, X. Chen, T. Thomas, A. Sagle, J. Maldonado, B.

Shamoun, P. Allen, and M. Gesley

J. Vac. Sci. Technol. B 20, 2657 (2002)

Progress toward a high-brightness photoemission source for multiple-electron

beam lithography

S. T. Coyle, A. Fernandez, G. Janaway, A. Sagle, and M. Mankos

J. Vac. Sci. Technol. B 19, 2581 (2001)

Electron--electron interactions in multibeam lithography columns

M. Mankos, A. Sagle, S. T. Coyle, and A. Fernandez

J. Vac. Sci. Technol. B 19, 2566 (2001)

Basic constraints for a multibeam lithography column

M. Mankos, S. Coyle, A. Fernandez, A. Sagle, W. Owens, J. Sullivan, and T.

H. P. Chang

J. Vac. Sci. Technol. B 19, 467 (2001)

Multisource optimization of a column for electron lithography

M. Mankos, S. Coyle, A. Fernandez, A. Sagle, P. Allen, W. Owens, J. Sullivan,

and T. H. P. Chang

J. Vac. Sci. Technol. B 18, 3010 (2000) PDF (558 kB)

System architecture choices for an advanced mask writer (100 to 130 nm)

Varoujan Chakarian et al.

Proc. SPIE Int. Soc. Opt. Eng. 3873, 228 (1999)

Design considerations for an electron-beam pattern generator for the 130-nm

generation of masks

Frank E. Abboud, Sergey V. Babin, Varoujan Chakarian, Abe Ghanbari,

Robert Innes, Frederick Raymond III, Allan L. Sagle, and Charles A. Sauer

Proc. SPIE Int. Soc. Opt. Eng. 3748, 385 (1999)

Low and medium energy physics experiments

Neutron-deuteron analyzing power measurements at 50 MeV. I. Backward

angles

J. L. Romero et al.

Phys. Rev. C 25, 2214 (1982)

Time reversal and charge symmetry studies in single nucleon transfer reactions

in the A = 5 system

A. L. Sagle, F. P. Brady, J. L. Romero, B. E. Bonner, N. S. P. King, M. W.

McNaughton, and H. E. Conzett

Phys. Rev. C 25, 1685 (1982)

Measurement of deuteron-deuteron elastic scattering at 5.75 GeV/c

Edgar T. Whipple, V. Perez-Mendez, A. L. Sagle, R. L. Talaga, F. Zarbakhsh,

J. B. Carroll, G. J. Igo, J. B. McClelland, M. Bleszynski, and K. Ganezer

Phys. Rev. Lett. 47, 774 (1981)

Correlations at small relative momenta among protons produced in collisions of

1.8 GeV/nucleon [sup 40]Ar with a KCl target

F. Zarbakhsh et al.

Phys. Rev. Lett. 46, 1268 (1981)

Search for quark effects in the d+[sup 4]He system

J. B. McClelland, J. B. Carroll, G. J. Igo, J. Oostens, F. Brochard, V. Perez-

Mendez, A. L. Sagle, R. Talaga, E. t. B. Whipple, and F. Zarbakhsh

Phys. Rev. Lett. 45, 1674 (1980)

Tensor analyzing power in pd backward scattering at GeV energies

G. Igo et al.

Phys. Rev. Lett. 43, 425 (1979)

p-[sup 4]He elastic scattering at 5.75 GeV/c

M. A. Nasser et al.

Phys. Rev. C 17, 1748 (1978)

p-[sup 4]He elastic scattering at 1.05 GeV

J. V. Geaga, M. M. Gazzaly, G. J. Igo, J. B. McClelland, M. A. Nasser, A. L.

Sagle, H. Spinka, J. B. Carroll, V. Perez-Mendez, and E. T. B. Whipple

Phys. Rev. Lett. 38, 1265 (1977)

Patents

1 6,724,002 Multiple electron beam lithography system with multiple beam modulated

laser illumination

2 6,326,635 Minimization of electron fogging in electron beam lithography

3 6,262,429 Raster shaped beam, electron beam exposure strategy using a two

dimensional multipixel flash field



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