Engineer Manager
Resume:
C. PODPORA
*************@*****.***
SPECIALIST ENGINEER
Materials Analysis & Characterization Design Verification Failure
Analysis
0. Multidisciplinary solutions for characterization projects that will
provide the company a competitive edge.
1. Expert judgment in the formulation of analysis direction, required
detail, and essential timeframe.
2. Extensive experience with advanced materials analysis and
characterization techniques.
3. Organizational goals: to provide reliable, accurate, & applicable
laboratory services.
4. Responsible for root cause failure analysis projects from initial
investigation to documented completion.
5. Ability to calmly organize and accurately complete multiple
characterization projects to meet deadlines.
6. Techniques: SEM, EDS, EBSD, FIB, EMP, WDS, TEM, DCP, XRD, MRD, XRF,
RBS, MICROSCOPY.
PROFESSIONAL EXPERIENCE
Materials Characterization, Verification & Failure Analysis Engineer
Contract Consultant onsite -- Engineering Department
Lasertel, Inc.
Tucson, Arizona
2006 / 2003-2004 full time on-site consultant; 2010 - 2005 authored
collaborative publications
Comprehensive investigative analyses and verification of successful
manufacturing process and product design. In-house documentation and
external marketing-to-customer product analysis reports.
Organizational
. Established requested infrastructure for a Materials Analysis
Characterization & FA Department.
. Worked with engineering, manufacturing and sales areas on several
materials analysis investigations.
. Provided detailed reports concerning both root cause materials failure
analysis and electronic materials failure analysis to Engineering, and
Manufacturing. Utilized both onsite and offsite advanced techniques.
. Equipment upgrades & retrofits performed in order to bring in-house
analytical equipment on-line.
. Compiled cost quotes and specifications for possible and future in-house
equipment acquisitions.
Projects - Materials - Techniques
. Techniques utilized include SEM, EDS, FIB, SIMS, Ellipsometry and basic
optical methods.
. Verification of component materials such as: solders, heatsinks, thin
films, barrier layers, reflective and antireflective coatings, electronic
components, epitaxial compound semiconductor material.
. Completed Projects & Investigations: metallurgical interface studies;
physical structure integrity verification; chemical composition
confirmation of the various parts of the diode package assemblies.
Materials Characterization & Failure Analysis Engineer
Materials Analysis & Characterization
Spectra Physics Lasers and Photonics / Newport Corporation
Tucson, Arizona & Mountain View, California
1996 to 2003
Established the Materials Analysis and Characterization area as an internal
company-wide service provider. Analyses reports, of various depths,
typically resulted in: a) the positive verification of a successful
manufacturing process, b) bringing a production group back on line after a
manufacturing concern, c) the confirmation of a newly engineered product
design either via a chemical composition analysis or a visual integrity
check and c) Responsible for root cause failure analysis projects from
investigation to documented completion.
Materials Characterization / Failure Analysis Engineer
Spectra Physics Lasers & Photonics - now Newport Corporation 1996 to 2003 -
(cont.)
Implementation of industry competitive analytical capability :
. Established the SEM/EDS Scanning Electron Microscopy Laboratory.
. Initiated the utilization of the FIB Focused Ion Beam technique as a
complementary analysis.
. Implemented the utilization of TEM - Transmission Electron Microscopy for
epitaxial layers.
. Wrote proposal for acquisition of FIB-SEM - Focused Ion Beam Instrument.
. Acquired and set up the MRD X-Ray Diffractometer for epitaxial films.
. Introduced the use of RBS Rutherford Backscatter Spectrometry for thin
film phase integrity.
. Investigated and acquired: new EDS system ( hardware & software ) for SEM
retrofit; Monte Carlo electron interaction volume calculation software;
MRS III - NIST certified - SEM calibration standard.
Organizational contributions:
. Initiated the procedure for the expedient and fair requisition of
materials characterization analysis.
. Acquired, reported, and interpreted results as applicable to the level of
the requested investigation.
. Comprehensive documentation report subject matter included: Product
Applications, Development, Engineering, Reliability, Failure Analysis,
Clean Room Fabrication, Processing and Manufacturing.
. Provided detailed reports concerning both materials failure analysis and
electronic materials failure analysis.
. Managed and maintained all aspects of the laboratory: throughput, service
contracts, supplies, budget.
. Maintained a reference archive of material analysis characterization
documentation.
. Attended international conferences, reported back on cutting edge
analysis techniques in order to maintain a competitive advantage for the
company.
. Prepared presentations for visiting customers, engineering, and
management meetings.
. Functioned both as an internal service provider to the individual
engineer, as well as a contributing member of various interdepartmental
engineering and application teams.
Projects and materials analyzed - Engineering & Manufacturing:
. Materials verified, investigated and documented include: Semiconductor
epitaxial crystals; thin film metallizations, oxide barrier thin film
dielectrics; AR HR coatings; various bonding solders; ceramics; heatsink
metals, fiber optic & electronic components, polymers; crystalline
materials; diode packages.
. RBS of thin film metallization barriers for stoichiometric composition.
Interpret SIMS; AFM.
. FIB investigations of all component materials of the laser diode device
& package; TEM interface investigation of epitaxial layer designs;
SEM/EDS of surface features, morphology of defects, wafer contamination,
new product profiles and designs, vendor material checks.
. FIB of semiconductor to solder interfaces, metallurgical study of
morphology and composition of the intermetallics, EBSD phase
identification of intermetallics, enabling process parameters to be
bracketed by binary and ternary phase diagrams.
Research Specialist / Laboratory Manager
Professional University Research Staff Position
Arizona Materials Laboratory / Materials Science Department
The University of Arizona - Tucson, Arizona
1994 to 1995
Management and supervision of AML's Transmission and Scanning Electron
Microscope facility. The facility included a High Resolution TEM - Hitachi
8100 - with EDS, EELS, STEM capability; an SEM/ EDS X-ray; support
facilities for sample preparation: cross-sectioning lab, ion milling,
photography dark room.
. Assisted outside commercial industry customers with their analyses.
. Instructed internal personnel on technical updates of the
instrumentation.
. Preventative maintenance of filament, column, hardware and software for
the SEM and TEM.
. Sample preparation by the physical cross-sectioning, and ion milling
technique.
. Image hardcopies and negatives processed by traditional dark room
methods.
. Taught hands-on operation of the laboratory TEM course to graduate and
undergraduate students.
. Accomplishment: a) Successfully improved the operation of the TEM's
filament lifetime by monitoring the technical aspects of the instrument,
use, and performance. b) Organized the lab instruction course.
. Utilized the TEM to analyze: semiconductor compounds, carbon nanotubes,
various inorganic materials.
Laboratory Manager
Grant funded Temporary Research Staff
Earth and Space Sciences Department
State University of New York at Stony Brook - Stony Brook, NY
1994
Management, supervision, laboratory maintenance, and procurement of
supplies for the Experimental Petrology Laboratory. Instructed students
and visiting researchers in the use of equipment and in experimental
techniques.
. Designed and performed experiments.
. Conducted X-ray diffraction and electron microprobe analyses (Cameca
MBX).
. Utilized high pressure - temperature apparatus and evacuated silica tube
techniques.
Instrumentation Analyst
Professional University Permanent Research Staff
The Department of Geological Sciences
The University of Texas at El Paso - El Paso, TX
1984 to 1994
Oversaw daily operations of four analytical and research laboratory
facilities.
. Provided analytical services for interdepartmental lab customers: XRD,
DCP, EMP.
. XRD - X-ray diffraction - conducted analysis on inorganic materials and
mineral phases.
. DCP - Direct Current Plasma Spectroscopy. Prepared samples for bulk
analysis via solution.
. EMP - Electron Microprobe - Assisted in the investigative comparison,
purchase, installation, and operation of the Cameca SX50 Electron
Microprobe.
. Taught introductory instruction lab of Electron Microprobe instrument
course.
. Coordinated priorities of research groups consisting of undergraduate and
graduate students in conjunction with the agendas of each laboratory
director and professor.
. Taught the laboratory section of the graduate level "Analytical Methods"
course.
. Instructed all levels of personnel in analytical procedures, protocols,
and experimentation methods.
. Participated in the planning, expansion and new building move of
department analytical facilities.
. Prepared annual procurement budgets for laboratory facilities. Equipment
troubleshooting.
. Conducted research: inorganic synthesis of solid mineral phases via high
temperature evacuated silica tube technique; carbonate solution
precipitation experiments; all evaluated by: XRD, DCP, EMP, BET.
Research Technician
Professional University Research Staff Position
The Department of Earth and Space Sciences
SUNY at Stony Brook - Stony Brook, NY
1981 to 1984
Oversaw and assisted with the daily operation of the Experimental Petrology
Laboratory.
. Prepared chemical powder formulations for experimental phase studies.
. Constructed ternary phase diagrams based upon experimental phase studies.
. Identified mineral phases by X-ray diffraction and electron microprobe
analysis.
. Instructed all new laboratory users and personnel: undergraduate,
graduate, faculty.
. Performed maintenance, troubleshooting, and repair of analytical
instrumentation.
. Taught hands-on experimental laboratory methods course for the lecturing
professor.
. Presented the published results of independent and collaborative research
at national professional meetings ( GSA - the Geological Society of
America and the AGU - the American Geophysical Union ).
INTERNSHIP
Lunar & Planetary Institute internship: The Lunar and Planetary Institute
and the Experimental Petrology Laboratory at adjacent NASA onsite
laboratories, Houston, TX.
Internship program, 4 months with stipend compensation, awarded on the
basis of academic background, research interests, and merit, via a
competitive national application procedure. See LPI website.
Interned with LPI Scientist/advisor on two projects. Conducted materials
phase experiments utilizing high temperature & high-pressure equipment.
Analyzed and identified the resulting experimental inorganic compounds by X-
ray powder diffraction. Compiled geologic map data from Russian for a
mapping project.
EDUCATION
B.S. Degree: SUNY at New Paltz / Geology and Geochemistry
Graduate course work: SUNY Stony Brook & UT El Paso / Geology and
Chemistry.
Graduate Degree MS: Materials Science emphasis (currently: on hold
/ company sponsored)
PROFESSIONAL AFFILIATIONS
MSA / MAS: Microscopy Society of America / Microbeam Analysis
Society
EDFAS / ISTFA / ASM: Electronic Device Failure Analysis Society /
International Society
for Testing and Failure Analysis / a division of ASM
PROFESSIONAL SHORTCOURSES
Case Studies of Failure Analysis using Microscopy and Microanalysis, pre-
meeting short course 21-04 Microscopy and Microanalysis, Long Beach, CA.
Microelectronics Seminar, EDFAS / ISTFA 26th & 27th International Symposia
for Testing and Failure Analysis, Seattle, WA; Santa Clara, CA.
Semiconductor Characterization, Reliability and Failure Analysis,
Arizona State University, Tempe, AZ. Dr. D.K. Schroeder, College
of Engineering & Applied Sciences
Microanalysis and Imaging, Kevex (Noran), Redwood City, CA.
Trace Element and Surface Analysis, Charles Evans & Associates/ Evans
Analytical.
REFERENCES
Available upon request.
PUBLICATIONS
Additional available upon request.
In Progress for FA session, C Podpora (author), M McElhinney, and R Walker,
Microscopy & Microanalysis / or EDFAS 2011 Meeting and Proceedings.
( Lasertel Inc. collaboration)
Materials FA Investigation of a Semiconductor Laser Diode package with SEM
FIB EDS and correlation with the Feedback Oxidation Loop of FA literature,
C Podpora (author), M McElhinney, and R Walker, Microscopy & Microanalysis
2005 Proceedings, Volume 11. ( Lasertel Inc. collaboration)
PERSONAL DATA
Citizenship: U.S. Born: Brooklyn, New York.
Languages: Native: English, Studied: Polish, Russian, French.
Current address: 5800 N. Kolb Rd, Tucson, AZ 85750. Previous: Port
Jefferson, New York; &, El Paso, TX.
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