Research Assistant Proferssor

MENGJUN BAI

**** **** **. ******** ** *****

Email: *****@********.***, ********@*****.***

Phone: 573-***-**** (O), 573-***-**** (cell)

Working Status: US Legal Permanent Resident

OBJECTIVE: Seeking to find a position of Metrology engineer position inside a leading company where I can utilize my theoretical and practical skills, working experience and knowledge in this area.

Summary Statement

• More than 10-years of laboratory experience in inorganic/organic thin film preparation and characterizations in nano scale related to structure, surface and physical properties, documentation and integrity management of laboratory facilities.

• Well-rounded background of multiple disciplines including condensed matter physics, materials science and engineering, biophysics.

• Strong instrumentation and troubleshooting skills, including experience with SEM, TEM, AFM, XRD/XRR, optical spectrometers (ellipsometers, UV-Vis spectrometer, Raman, FTIR).

• Strong interpersonal skills and experience through teaching, training and service to students, staff and other clients.

Experience Highlights

1. Hand on skills

• SEM, TEM, AFM, EDS, XRD/XRR, FTIR, Raman, VASE (ellipsometer) and UV-Vis optical spectrometers.

• Electronic signal detections using oscilloscopes, multi-meters, power meter and function generators, lock-in amplifier.

• High vacuum systems.

• Clean room experience.

2. Material Knowledge

• Metallic, ceramic semiconductor thin films.

• Dielectric and conducting polymer thin films.

• Bio-lipid / protein embedded thin films.

• Organic / inorganic and RNA based Si nano particles.

3. Materials Preparation and Post Treatment

• Material preparation methods: magnetron sputtering, thermal and e-beam, MWCVD, PECVD, spin-coating.

• Post treatments (bulk and surface): thermal annealing, RTP annealing, oxidizing.

• Patterning: photolithography, ion beam pattern, laser irradiation.

4. Sample investigation and evaluation

• Surface, interface, defects, structure, physical property and their relations

• AFM, TEM, SEM, EDS, XRD (powder, thin film), XRR, Four-point probe Hall effect, IV, CV, photosensitivity, optical spectrometry, VASE (ellipsometer), Raman, Photoluminescence.

5. Recording, report keeping and training

• Provided technical training for co-workers, students, staffs and technicians.

• Frequent discussions with operation teams to tackle problems actively and proactively.

• Prepared technical reports at all levels.

• Prepared inspection and evaluation treatment bidding with an effort to reduce cost and enhance performance functionality, including scope of work, comparison and evaluation.

• Update inspection and evaluation records periodically, especially for safety and mechanical systems.

• Conduct, request and review facility failure analysis.

6. Integrity Management

• Ran data analysis reports.

• Evaluated material defects and made recommendation about modification or replacement.

• Facility routine maintenance, upgraded, rebuilt and fabricated mechanical parts, prepared historical inspection records.

• Identified key process indicators and unit operation envelope for route operations and inspections.

• Reviewed, modified and developed O&M procedures.

Education

• Ph.D. Jan. 1997/Dec. 2002, Condensed Matter Physics, University of Nebraska.

• B.S., Sept. 1979/Jul. 1983, Condensed Matter Physics, Zhengzhou University, China.

Employment

• Research Assistant Professor/ Research Associate, University of Missouri-Columbia, Sept. 2004-Present.

• Post doctoral/Research Assistant, Nebraska Center for Materials and Nano science (NCMN), University of Nebraska-Lincoln, Jan.1997 – Aug. 2004.

• Lecture, Zhengzhou University, China, Jul. 1983 Dec.1996

Publications /presentations/patent

• 21 refereed publications in international journals (Appl. Phys. Lett, J.Appl Phys, JPCM, Epl), 11 international conference presentations and 1 patent.

Contact this candidate