Software Engineer Developer

Peter Waksman , Ph.D.

Contact:

** ***** **

Concord, MA 01742

Home 978-***-****

Cell 978-***-****

********@*****.***

Summary:

Imaging System, 3D, and Statistics Developer. With more than 15 years of commercial product development in Windows and Unix using C++.

A PhD in Mathematics.

Have worked with a wide variety of electro-optical, and phased-array imaging systems, and am familiar with applications in medicine, inspection, desktop imaging, and printing.

Experience:

2010-2011 Principal Software Engineer, Sensable

- CAD Dentures: created world’s first automated system for designing dentures by computer; allowing designer to place and adjust virtual teeth in the context of 3D scanned bite impressions. Did all algorithms and UI design.

- Used distance fields, moving coordinate frames, and surface analysis techniques.

- Filed patent claims.

2005-2010. Software Engineer Ultrasound R&D , Philips Medical Systems

- One of the 3D UI developers. Used DirectX for 3D navigation support.

- Implemented UI simplifications and doubled performance of volume rendering; implemented new voltage setting strategy for dedicated ASIC. Routinely assess and fix bugs, document system changes, run regression tests, mentor junior engineers.

- DICOM and FDA regulations. - Ran clinical evaluations at local hospitals.

2003-2005 Independent Consultant

- (L3-Communications. Woburn, MA) Millimeter Wave camera software – GUI development and translation of object detection algorithms from MATLAB into C++

- (KLA-Tencor, Milpitas CA) Algorithm designer of pattern recognition feature, for semiconductor bin-sort wafer map applications. Algorithms re-sold by client.

- (Ontar Corporation, North Andover MA) Created Phase I SBIR prototype data mining tool for detecting Adverse Drug Effects, using FDA Vaccination ADE databases. Used my own decision-tree algorithms and my own data equilibrium equations.

2002–2003 Lead Technical Developer, Applied Geometry[startup]. Lincoln, MA

- Created pattern recognition product for semiconductor defect wafer maps. Managed $200K budget: one other developer, QA person, and field engineers. Filed Patent on chi-squared pattern detection method.

- Managed small team of 4: 1 other developer, 1 QA person, and application engineers. Interacted with manufacturing customers at IBM and in Taiwan.

2001–2002 Resident Statistician/Product Manager, HPL(formerly DYM). Bedford MA

- Created Work In Process (“WIP”) Data Mining product for wafer manufacturing root cause analysis. Used tree algorithms. Managed one other developer.

- Provided marketing and sales support to major semiconductor manufacturers in Taiwan (UMC, TSMC)

1997–2001 Principal Software Engineer OAK (formerly Xionics) . Burlington, MA

- Designed and developed new color management architecture within company’s Postscript and PCL printer languages. Improved color printing speeds by factor of six. Software used by leading printer vendors world-wide. Managed development of Xip-Print TIFF image printer driver.

- Patent on fast color caching

1996-1997 Senior Software Engineer, Hologic Corp. Waltham , MA

- Managed new release of bone densitometer product.

- Coded and debugged software for X-Ray based imaging system

1993-1996 Senior Software Engineer, Polaroid Corp. Cambridge, MA

- Created color calibration software for cameras, scanners, printers. New least squares inversion methods for 3D data fitting

- Developed focus and image alignment tool as part of manufacturing LED printer. Used MTF, FFT and Subjective Quality Function (SQF) to optimize image quality.

- Company representative to the ICC (Inter Color Consortium)

1991–1993 Consultant. Eutecnics. Acton, MA

- Image Alignment algorithms for semiconductor mask inspection system

- New least squares method for fitting grid to data.

- Created Gerber File Reader for design-based inspection setup

- Created decision tree algorithm engine

1988–1991 Senior Scientist Nanometrics (formerly Interactive Video Systems). Concord, MA

- Created edge detection technology that enabled the company to maintain world leadership in optical measurement precision for more than ten years. Improved semiconductor optical CD measurement precision by a factor of 10. Developed contact/via layer measurements and optimized algorithms for auto-focus, alignment, defect counting and sizing.

1986–1987 Visiting Professor, Dept. of Mathematics, University of Rochester. Rochester, NY

1983–1986 Assistant Professor, Dept. of Mathematics, University of Southern California. Los Angeles, CA

- Research in Geometry and Analysis, applied to shape and texture recognition problems.

- Taught undergraduate mathematics courses at all levels.

- Published more than 10 articles in refereed Journals.

- Received NSF Grant. Received Patent on image recognition system.

Education 1983 Ph.D. in Mathematics University of Minnesota. Minneapolis, MN

- GPA 3.8. 1st in Analysis.

1975 B.A. in Philosophy Boston University. Boston, MA

- GPA 3.2 . graduated Magnum Cum Laude

Interests Concord MA Historical Commission, digital photography, archeology, music.

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