YORICK WAHAUS
**** ** ********** *** 541-***-****
Corvallis, OR 97330 ******.******@*****.***
http://www.linkedin.com/pub/yorick-wahaus/b/758/967
SUMMARY
Eleven years of engineering experience including yield, visual inspection, defect reduction,
CMP/grind process engineering, and environmental engineering. Engineering owner of visual
inspection tools, review tools, SEMs, CMP tools and Abatement tools. Collaborated with
engineering partners in Singapore to ensure our processes were converged. Lead and performed
multiple defect reduction projects on various products. Evaluated SEM’s and inspection tools for
purchase. Determined and rolled out best system to document the defect learning’s of the fab and
make them accessible fab-wide. Participated in multiple Klarity beta tests, using the beta version
software, documenting problems and participating in weekly review meetings. Developed, tested,
implemented & documented multiple grind and CMP processes for various products during
development
• • •
Klarity Defect Expert Experienced in JMP Proficient in MS Office
• • •
Applied Statistical MEMs Processing Mentored Technicians
Process Control (SPC)
PROFESSIONAL EXPERIENCE
Hewlett-Packard Company, Corvallis, Oregon 2001 – 2012
HP is a technology company that explores how technology and services can help people and
companies address their problems and challenges, and realize their possibilities, aspirations and
dreams.
CMP/Grind Process Engineer 2009 - 2012
Responsible for ensuring CMP/Grind is qualified and characterized to process TIJ, PIJ and
Richter.
• Performed characterization study of SU8 at CMP as a member of the 2LM SU8 process
characterization team.
• Developed CMP/Grind process for Richter (MEMs Sensor).
• Consolidated CMP portion of the CMP/Grind work center into Fab-22 without any interruption
to production.
• Mentored technician to takeover day to day engineering responsibilities for TIJ process.
Environmental Engineer for TDO 2011 – 2012
Maintain engineering models of VOC's, PFC's NH3 and Lead for the TDO fabs. Use models to
determine abatement needs for various process tools. Provide engineering support for abatement
tools.
Visual Analysis Yield Engineer 2007 – 2009
Was responsible for ensuring visual SU8 yield goals were met by monitoring and reacting to SU8
visual and electrical defects.
• Assisted barrier engineering to determine root cause of various SU8 defects
Defect Analysis/AIT Engineer 2001 – 2007
Responsible for ensuring the AIT’s were qualified and characterized to inspect TIJ and Richter.
Responsible to monitor AIT defect rate for Fabs-21 & 22.
• Set-up automated on-line defect reports for multiple inspection steps.
• Launched and participated in multiple defect reduction efforts and excursions for the back end
of line.
• Planned and executed AIT strategy due to fab-21 consolidation with minimal impact to
production.
• Enabled AIT-XP to be used as a yield screen for resistor area defects.
EDUCATION
Master of Science, Chemical Engineering,
Integrated Minor: Emphasizing thin film silicon processing
Project: Empirical correlation of spin coating Newtonian fluids on silicon wafers.
Oregon State University, Corvallis, Oregon
Bachelor of Science, Chemical Engineering,
Materials Engineering Option
Oregon State University, Corvallis, Oregon
PROFESSIONAL DEVELOPMENT
Attended the Lehigh Microscopy School in 2003