ICT Test Engineer

EDWARD BILLINGSLEY

Santa Clara, California ****4

408-***-**** ¦ ************@*****.***

IN-CIRCUIT TEST ENGINEER

Electronic Manufacturing ¦ Contract Manufacturing

Combines astute, multi-disciplined high technology experience with more then a 15-year track record of successful performance developing in-circuit test programs and fixtures, implementing successful test processes and procedures, and maintaining a balance between immediate commitments and long-term objectives. Thrives in a high-pressure, deadline-oriented contract manufacturing environment; able to resolve issues alone or in cross-functional teams. Highly developed interpersonal communication skills, able to act effectively in client facing situations. Skilled Kaizen event facilitator, takes initiative as a leader or as a team member.

RELEVANT SKILLS

* Agilent 3070

* GenRad 2272

* GenRad 228x

* Teradyne 1800

* Testronics 401

* Fairchild 303/333

* Asset-Intertech Scanworks

* JTAG

* Boundary-Scan

* Electrical Test Equipment

* Analog Technologies

* Digital Technologies

* Programmable Logic Devices (PLD)

* EEprom Programming

* RF/Microwave Technologies

* IEEE Interfaces

* Design-for-Test (DFT)

* Oscilloscopes

* DVM Meters

* Fabmaster

* LabVIEW Programming

* Gauge R&R

* Unix

* DOS

* Windows

* BtBasic

* C

* AWK

* Pascal

* MS Word

* MS Excel

* MS Power Point

PROFESSIONAL EXPERIENCE

Flextronics International Ltd., (Solectron Corporation) Milpitas, CA 2004 - 2009

SENIOR TEST ENGINEER

* Provided installation and production maintenance of In-Circuit Test (ICT) and JTAG programs in high volume manufacturing arenas.

* Experienced with Agilent 3070, GenRad 228x, Teradyne 1800, Testronics 401, and the Asset-Intertech JTAG test platforms.

* Reengineered testplan configurations to extend failure diagnostics; conducted root cause analyses to identify in-circuit test intermittent failures and reduce their occurrence.

* Forced scheduled fixture maintenance by developing and implementing software controls.

* Created custom solutions for Flash Memory devices using hex and S records, PLD in-system programming, and Serial EEprom programming.

* Quickly addressed in-circuit test issues; maintained yields at or above 98%.

* Prepared DFT assessments using schematics and software tools.

* Conceptualized / developed custom tools for Agilent In-circuit Test Programs.

* Primarily responsible for the on-site introduction of PC/Windows based test platforms for Agilent and GenRad test systems at Flextronics.

* Participated in regular reviews of customer test data and RMA issues with the production Customer Focus Teams.

* Experience with Agile Documentation and Production Control System.

* Led / participated in regular site engineering Kaizen activities.

Turnkey Test, Inc., Pleasanton, CA 1987 - 2004

SENIOR TEST ENGINEERING CONSULTANT

* Developed In-circuit Test Programs utilizing the Agilent 3070, GenRad 2272/228x, Teradyne 1800, Fairchild Series 30, and the Asset-Intertech JTAG test environments.

* Created custom solutions for Flash Memory devices using hex and S records, PLD in-system programming, and Serial EEprom programming from customer supplied data.

* Recruited and led team members in the development of complex linear devices, including Digital to Analog, Analog to Digital and fixture design/electronics for custom test requirements/high frequency measurements.

* Prepared DFT assessments using schematics and software tools.

PARTIAL LIST OF ICT CLIENTS

- Juniper Networks -

- F5 Networks -

- Silicon Graphics (SGI) -

- Aspect Communications -

- 3PAR -

- WhereNet Corporation -

- Cisco Systems -

- Force 10 Networks -

- Motion Control Engineering -

EDUCATION

Associates Degree, Electronics Technology

Foothill College, Los Altos Hills, CA

Associates Degree, Mathematics

Columbia College, Columbia, CA

Contact this candidate