FATIMA ZOHRA AMIR
Arlington, Texas 76013
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SUMMARY OF EXPERIENCE
Fourteen years teaching Experience as a Lecturer and as a Teaching Assistant.
Over seven years in Research working with x-ray diffraction for thin film characterization.
Over three years of experience with Maintenance and Operation of High vacuum equipment MBE (Molecular Beam Epitaxy) systems for semiconductors growth.
Over two years of experience of growth of semiconductors nanolayers for Solar cells applications.
Over three years of experience with SEM (Scanning Electron Microscopy) characterization and EDS (Energy Dispersive Spectroscopy).
Over two years of experience with FIB (Focused Ion Beam) and E-beam writing lithography.
Experience with Current-Voltage (I-V) and Capacitance-Voltage (C-V) characterization.
Over two years of experience with AFM (Atomic Force Microscopy) characterization.
Over three years of Clean Room experience.
EXPERIENCE
July 2007-Present Research Engineering Scientist, Nanotechnology Research and Teaching Facility, University of Texas at Arlington-Texas.
Characterization of Si-based materials and thin films using Confocal Microscope, Reflectometer, Profilometer, Ellipsometer, SEM (Scanning Electron Microscopy), and AFM (Atomic Force Microscopy).
Responsible of FIB (Focused Ion Beam) writing and E-beam writing lithography.
Training graduate students on different characterization equipment.
Feb.2007-June 2007 Material Characterization Engineer, Material Science Department, University of Texas at Arlington-Texas.
Troubleshooting of the different characterization equipment.
Training graduate students on X-ray equipment and SEM equipment.
Feb. 2006-Jan 2007. Postdoctoral Research Associate, Nanotechnology Research and Teaching Facility, University of Texas at Arlington-Texas.
MBE growth of II-VI for solar cell applications.
X-ray Diffraction Analysis.
I-V, C-V Characterization.
Jan.2004- Jan.2006. Postdoctoral Research Associate, Semiconductors Physics Laboratory, University of North Texas-Denton-Texas.
Operating and Maintenance of High Vacuum Equipment MBE (Molecular Beam Epitaxy) systems (changing thermocouples, filaments), and semiconductors growth.
Upgrading the Gen II Varian MBE system by installing a Nitrogen Plasma source.
Growth of Ga:Bi:N:As on GaAs Substrates.
Growth of In:N:Sb on InSb substrates and In:N:As on InAs substrates.
X-ray measurements on Fe(SiGe)2 and Os2Si3 thin films grown on Si substrates.
X-ray measurements on Ga:Bi:N:As and Ga:N:As films.
Raman measurements on In:Bi:Sb on InSb Substrates.
Jan.1999- Dec.2003. Research Assistant\Teaching assistant, X-ray Diffraction Laboratory, University of Houston-Texas.
X-Ray diffraction measurements on different ferroelectrics samples (In plane and Out of plane measurements and reflectivity measurements).
Crystal Truncation Rod diffraction on BaSrTiO3 thin films.
Grazing Incidence on BaSrTiO3 thin films (Measurement performed in X22C station at the NSLS in Brookhaven National Laboratory).
Writing a Fortran Code for analysis of Crystal Truncation Rod diffraction data.
Teaching Introductory Physics Labs.
Sept.1990- Dec.1998. Lecturer, Université des Sciences et de la Technologie d’Oran- Algeria.
Courses taught:
General Physics.
Classical mechanics.
Electromagnetism.
Mechanics of Fluids.
Waves guides.
VISITING RESEARCH APPOINTMENTS
Summer 1997 Visiting Research Scholar, Laboratory of Acoustics-Université du Maine, Le Mans-France.
Theoretical Calculations on transitivity of GaAs Quantum Wells part II.
Fall 1996 Visiting Research Scholar, Laboratory of Acoustics-Université du Maine, Le Mans-France.
Theoretical Calculations on transitivity of GaAs Quantum Wells part I.
Fall 1992 Visiting Research Scholar, A.I.M.E, Université Paul Sabatier, Toulouse-France.
Fabrication and characterization of transistors.
Summer 1992 Visiting Research Scholar, Laboratoire d’Analyse des Composants, L.A.A.S, C.N.R.S, Université Paul Sabatier, Toulouse- France.
Writing software in Basic to monitor Current-Voltage and Capacitance-Voltage Experiments.
EDUCATION
Ph.D. in Physics, University of Houston-Texas, December 2003.
M.Sc. in Optoelectronic Physics, Université D’Es-Senia, Oran-Algeria, September 1990.
M.Sc. in Physics, Université des sciences du Languedoc–Roussillon,
Montpellier- France, June 1989.
HONORS
First Prize TcSAM Student Symposium (2002).
National School on Neutron and X-ray Scattering, Argonne National
Laboratory (2002).
GATF (Graduate Assistant Teaching Fellowship), Fellowship during Graduate studies (2000- 2003).
World Bank Fellowship (1992, 1996, 1997).
CNRS (Centre National de Recherche Scientifique) Fellowship (1988-1989).
PUBLICATIONS
Articles in Peer-Reviewed Journals
F.Z. Amir, K. Clark, E. Maldonado, J. Jiang, J.W. Ager III, K.M. Yu, W. Walukiewicz, W. P. Kirk, J. Crys. Growth 310, January 2008, Epitaxial Growth of Cd1-xSexTe Thin Films on Si (100) by Molecular Beam Epitaxy Using Lattice Mismatch Graded Structures.
R. J. Cottier, F. Z. Amir, W. Zhao, K. Hossain, B. P. Gorman, T. D. Golding, N. Anibou, and W. Donner, J. Vac. Sci. Technol. B 24 (3), June 2006, Molecular Beam Epitaxial Growth of Osmium Silicides.
F.Z. Amir, R.J. Cottier, T. D. Golding, W. Donner, N. Anibou and D. Stokes, J. Crys. Growth 294, July 2006, X-ray Diffraction Analysis on an Osmium Silicide Epilayer Grown on Si (100) by Molecular Beam Epitaxy.
R. J. Cottier, F.Z. Amir, K. Hossein, L.J. Mitchell, J.B. House, B.P. Gorman, O.W. Holland, T.Golding. J. Vac. Sci. Technol. B 23 (3), May/June 2005, Molecular Beam Epitaxial Growth of Fe(SiGe)2 Epilayers.
Published Abstracts
N. Elmarhoumi, R. J. Cottier, F.Z. Amir, G. Merchan, A. Roy, H. Geisler, C. A. Ventrice, and T. Golding, Synchrotron –Based X-Ray Absorption Spectroscopy of Iron Silicon Germanide and Osmium Silicide Grown by Molecular Beam Epitaxy. American Physical Society, Texas Section Meeting, October 2008, El Paso, Texas.
N. Elmarhoumi, R. J. Cottier, F.Z. Amir, G. Merchan, A. Roy, H. Geisler, C. A.Ventrice, and T. Golding, Structure of Iron Silicon Germanide and Osmuim Silicide Epitaxial Films Measured by X-Ray Absorption Spectroscopy. American Physical Society, March Meeting 2008, New Orleans, LA.
N. Elmarhoumi , R.J. Cottier , F.Z. Amir , G. Merchan , A. Roy , H. Geisler, T. Golding, C. Ventrice, X-Ray Absorption Spectroscopy Study of Iron Silicon Germanide and Osmium Silicide Epitaxial Films. American Physical Society, Texas Section Meeting, October 2007, College Station, Texas.
F.Z. Amir, E. Maldonado, K. Clark, and W. P. Kirk, X-ray Diffraction Methods for Semiconductors Structure Analysis of Photovoltaic Devices. American Physical Society, Texas Section Meeting, October 2006, Arlington, Texas.
R.J. Cottier, W. Zhao, F.Z. Amir, W. Donner, N.Anibou and T. Golding, Magneto-Transport Studies of Molecular Beam Epitaxial Grown Osmium Silicides. American Physical Society, March Meeting 2006, Baltimore, MD.
R.J. Cottier, B.P. Gorman, F.Z. Amir, K.Hossein, O.W. Holland, A. Naogi, C.L. Littler, and T.D.Golding, MBE growth of Fe(Si1-x Gex)2/Fe(Si 1-x Gey)2 Heterostuctures and Multilayers. North American Molecular Beam Epitaxy Meeting, October 2004, Banff, Canada.
R.J. Cottier, K. Hossein, B.P. Gorman, D. Stokes, F.Z Amir, A.G. Bidwell, O.W Holland, A. Neogi, C.L.Littler and T.D Golding, Epitaxial Growth of Fe (Si1-x Gex)2 :Towards a Tunable Silicon Based Electro-Optic Material. 46th electronic Materials Conference, June 2004, Notre Dame, South Bend, Indiana.
F.Z Amir, W. Donner, S.C. Moss, M. Aspelmeyer, B. Noheda, X.X.Xi, Characterization of Ba0.5Sr0.5TiO3 Thin films by Crystal Truncation Rod and Grazing Incidence Diffraction. American Physical Society, March Meeting 2003, Austin, Texas.
F.Z Amir, W. Donner, S.C. Moss, M. Aspelmeyer, B. Noheda, X.X. Xi, Strain profile of Ba0.5Sr0.5TiO3 films by Crystal Truncation Rod. American Physical Society, Texas Section Meeting, October 2002, Brownsville, Texas.
F.Z Amir, Transmission in GaAs Quantum Wells. IMMS5, August 1997, Sidi Bel Abbes, Algeria.
PROFESSIONAL MEMBERSHIPS/ACTIVITIES
Member, American Physical Society.
Member, Neutron Scattering Society.
ADDITIONAL WORKS SKILLS
Good computer programming skills: (UNIX, PC): FORTRAN, Basic, Pascal and MathCAD.
Software experience: Origin, Excel, Specplot, and MDI Jade software.
Fluent in French.
REFERENCES
Dr Simon C. Moss
MD Anderson Professor Emeritus of Physics
Department of physics
University of Houston
617, Research Building I
Houston, TX 77204
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Dr Lowell T. Wood
Professor
Department of physics
University of Houston
617, Research building I
Houston, TX 77204
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Dr Terry Golding
Professor
Department of Physics
Texas State University
601, University Drive
San Marcos, TX 78666
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Dr Wolfgang Donner
Professor
Technische Universtat Darmstadt
Fachbereich Material- und Geowissenschaften
Strukturforschung
Petersenstrasse 23
64287 Darmstadt
*******@**-*********.**
Dr Paul Chow
Beam Scientist
APS/LOM434E
Argonne National Laboratory
9700 S. Cass Ave.
Argonne, IL 60439
*****@*****.***.***.***
Dr. Abdelhak Bensaoula
Research Professor
Department of Physics
University of Houston
617, Research building I
Houston, TX 77204
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Dr. Rebecca Forest
Instructional Assistant Professor
Department of physics
University of Houston
617, Research Building I
Houston, TX 77204
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