CURRICULUM VITAE
D.Rajesh,
S/o D.Satyanarayana, Email: **********@*****.***
Dno: 2-82, **********@*****.***
Durga Temple Street, Phone: +91-970*******
Savalyapuram,Vinukonda, +91-740*******
Guntur District, Andhra Pradesh.
CAREER OBJECTIVE:
To position myself in an enterprise where I shall get a chance to augment my technical skills and use them for the benefit of the society.
EXPERIENCE: Did Internship at Intel Technology India Private Ltd in Graphics DFX team for 8 months (Sep 2011 to May 2012).
ACADEMIC RECORD:
Class Board/University Year Percentage
M. Tech., VLSI Design. VIT University 2010-2012 7.3/10
B. Tech., EEE ANU 2004-2008 63.8
12th BIE - A.P. 2002-2004 87.2
10th SSC 2000-2002 77.7
TECHNICAL SKILLS:
• Programming Languages : Perl, UNIX commands, C, and C++.
• HDL Known : Verilog, System Verilog.
• Functional Verification Tool : Modelsim.
• Front end Tools : Design architect (Mentor Graphic’s), NC- sim (Cadence).
• Back end Tools : Soc Encounter (Cadence).
• Other Tools : Xilinx.
ACADEMIC PROJECT:
M.Tech:
TITLE: HVL AUTOMATED TEST ENVIRONMENT FOR VERIFICATION OF TAP CONTROLLER.
PROJECT DESCRIPTION:
Designed test environment to verify the functionality of TAP controller. Test bench designed using SystemVerilog.
TOOLS USED: VCS Simulator.
B.Tech:
TITLE: WAVELET BASED TRANSFORMER PROTECTION.
PROJECT DESCRIPTION:
In our project the main analysis is to” Distinguish between fault current and magnetizing inrush current”.
TOOLS USED: MATLAB SIMULATOR
MINI PROJECTS:
M.Tech:
TITLE: PERFORMANCE AND ENERGY CALCULATION OF FULL ADDER
PROJECT DESCRIPTION:
We have presented a less delay and lower power delay product circuit technique called transmission gate logic design based full adder.
TOOLS USED: DESIGN ARCHIET
TITLE: TEST PATTERN GENERATION WITH REDUCED SWITCHING ACTIVITY.
PROJECT DESCRIPTION:
This paper implements X-filling approach to reduce switching activity of the test patterns applied to CUT with scan based testing.
TOOLS USED: DFT ADVISOR, DEV C++.
PAPERS PRESENTED:
M.Tech:
• Presented a paper on “Performance and Energy Calculation of Full Adder” in International conference on Science, Engineering & Technology at VIT University.
• Presented a paper on “Test Pattern Generation with Reduced Switching Activity” in International conference on Science, Engineering & Technology at VIT University.
AREA OF INTEREST:
• ASIC
• VERILOG
• TESTING
• DIGITAL IC DESIGN
.
DECLARATION:
I hereby declare that the information furnished above is true to the best of my knowledge.
Date: (RAJESH DURISALA)