Vikrant More
**** ***** **** ****, ***# ****, Phone: 334-***-**** Bowie, MD, 20716 **************@*****.***
Objective:
Seeking full-time position which will utilize my technical, organizational, communication and problem-solving skills.
Education:
Master of Science in Mechanical Engineering, Dec 2010
Auburn University, Auburn, AL (GPA: 3.88/4.00)
Thesis: “Prognostics and Health Management of Lead free electronics subjected to Single Steady-State and Multiple Cycling Thermal Environments”.
Advisor: Dr. Pradeep Lall
Bachelor of Engineering in Mechanical Engineering; July 2006
University of Mumbai, Mumbai, MH, India (79%, 1st class with Distinction)
Work Experience:
Graduate Intern, (April 2010- Present)
Material Science and Technology Division, Oak Ridge National laboratory, Oak Ridge, TN
• Analysed dispersion of nano particles in molten steel using Finite Element analysis (Used Solid Works to design the system and Ansys Fluent for the Finite Element Analysis).
• Fatigue testing of Nickel based superalloys for Homogeneous Charge Compression Ignition (HCCI) engines.
Graduate Research Assistant, (August 2007-March 2010)
Centre for Advanced Vehicle Extreme Environment Electronics, Auburn University
Prognostication and Health Management of Lead free electronics subjected to Single and Multiple Thermo-Mechanical Environments (NASA)
• Developed a process for assessment of product damage prior to appearance of any macro-indicators like cracks and de-lamination.
• Prognosticated prior damage in an Electronic system based on a numerical technique called non linear least square method (Levenberg-Marquardt Algorithm).
• Conducted accelerated thermal cycling tests, thermal aging tests and collected reliability data for various BGA architectures. Analyzed the statistical data using two parameter Weibull reliability model.
• Developed finite element-based 3-D creep and plasticity models (ANSYS) to determine solder joint reliability of BGA and SOIC electronic packages.
• Fabricated PBGA and CABGA packages on PCB (Solder paste Printing, Pick and Place and reflow operations) further conducted cross sectioning, X-ray and Scanning Electron Microscopy (SEM), Optical Microscopy, EDX Elemental Analysis of packages to investigate indicators of failure.
Explicit Finite element modeling and Digital Image Correlation Life-Prediction of Lead free Electronics under Shock-Impact
• Experimented exhaustively with drop and shock testing of electronic boards as defined by JEDEC standard as well as in other orientations.
• Performed 3-D nonlinear finite element analysis to predict failure using techniques such as smear properties and Timo-shenko beam models for Drop/Shock conditions in ABAQUS.
• Researched an optical method; Digital image correlation in conjunction with ultra high speed cameras to study full field strain of electrical components.
Graduate Engineering Trainee, Quality in Supplies Department (Dec 2006 – July 2007)
FIAT INDIA PVT LTD, Ranjangaon, Pune, INDIA,
• Conducted Supply-Inspection of various Automobile components and checked for any anomalies based on norms provided by FIAT AUTO SPA, ITALY.
• Established communication with vendor’s in case of such anomalies and took corrective action.
• Coordinated communication between purchase dept, logistics dept, production dept and vendor.
• Hands on Experience on BAAN (Enterprise resource planning software), further used various measuring instrument like Co-ordinate measuring machines (CMM), Robotic arm etc to check for any non-conformity.
Software Skills:
• Modeling and Simulation: AUTOCAD, IDEAS, SOLID WORKS, HYPERMESH, ANSYS, ABAQUS.
• Math Packages: MATLAB, MATHEMATICA, MAPLE.
• Languages: C/C++.
• Sigma Plot, Coral-draw, IMAQ Image vision builder, Image Pro, Microsoft Office.
Selected Technical Publications:
Journal Publication
• Lall, P., Hande, M., Bhat, C., More, V., Vaidya, R., "Prognostication of system-state in lead-free electronics equipment under cyclic and steady-state thermo-mechanical loads," Microelectronics Reliability Vol. 49(), pp. 825-838, 2009.
• Lall, P., More, V., Vaidya, R., Goebel, K., Suhling, J.C., “ Assessment of Accrued Thermo-Mechanical Damage in Lead free parts during Field-exposure to Multiple Environments”, Journal of SMT Vol. 23, Issue 2, pp.11-24. 2010.
Conference Publication
• Lall, P., Hande, M., Bhat, C., More, V., Vaidya, R., Suhling, J.C., “Prognostication of System-State in Lead-Free Electronics Equipment under Cyclic and Steady-State Thermo-Mechanical Loads”, 2008 Thermal, Mechanical and Multiphysics Simulation and Experiments in Micro-Electronics and Micro-Systems, EuroSimE 2008, Freiburg, Germany.
• Lall, P., More, V., Vaidya, R.,., Suhling, J.C., “Remaining Useful-Life based on Damage Pre-Cursors for Leadfree Electronics Subjected to Multiple Thermal Environments”. 2009 Interpack, SF, California.
• Lall, P., More, V., Vaidya, R., Goebel, K., Suhling, J.C., “ Assessment of Residual Damage in Leadfree Electronics Subjected to Multiple Thermal Environments of Thermal Aging and Thermal Cycling”. 2010 ECTC, Las Vegas, NV.
• Lall, P., More, V., Vaidya, R., Goebel, K., Suhling, J.C., “Interrogation of Damage-State in Lead-Free Electronics Under Sequential Exposure to Thermal Aging and Thermal Cycling”. 2010 SMTAI conference, Orlando, FL.
Relevant Coursework:
Mechanics of electronic packaging, Introduction to Finite Element Analysis, Experimental Mechanics, Advanced Mechanics of material, Inelastic Stress Analysis, Mechanics of Composite materials, Digital Signal processing, Continuum Mechanics.
Achievements:
• Won the best of conference proceedings paper award at SMTAI 2010 conference, Orlando, FL.
• Outstanding Poster (Second Place) in Best Poster competition at IMECE 2009 Conference, Orlando, FL
• Graduate Fellowship, Auburn University, Aug`07- Present.