Test Engineer Manufacturing

Ralph (Butch) Thornburg

**** ****** ****, ** ***** Cell: 913-***-****

Email: **************@***.***

SUMMARY

Over twenty years of accomplishments in positions as test engineering, management, site management, NPI/ DFT/ DFM engineer, lead test engineer, test engineering trainer, test equipment manufacturing engineer and new test strategy development. I’ve demonstrated my abilities in these positions with America's premiere high tech, defense, information systems, computer and automotive companies. I have solid experience in all areas of in-circuit testing (Teradyne\GenRad\1800 & KeySight\Agilent\HP) with and without board handlers, Flying Probers (SPEA, Scorpion\Acculogic and SEICA), boundary scan (XJTAG, JTAG Technologies, Goepel, Corelis, Asset Intertech and Acculogic), functional electronic testing (Teradyne Spectrum 9XXX, L210, Agilent (HP) V, NI LabWindows and LabVIEW) and cable testing (Cirris). I have managed test strategies at contract manufacturing locations domestically and internationally as a customer and as a supplier. I have worked with ATLAS, DEC RSX, VAX, UNIX (LINIX), MS Windows, BASIC, C and GENRAD software for the development of test programs.

CLEARANCE

Inactive DoD Secret (Expired 2009); U.S. citizen, eligible for Clearance

EXPERIENCE

Ducommun 11616 East 51st St., Tulsa, OK. 74146 Senior Test Engineer

9-15-24 to Present

ICT support for TS124, Z1860, Teradyne Spectrum ICT and Agilent 3070.

DMP 2500 N. Partnership BLVD, Springfield MO, 65803, Electronic Test Programmer

9-23-2023 to 8-1-2024

Perform ICT development for Teradyne 51s Test Station inline handler system. Develop panelized test with parallel programming. Performed DFT for ICT and boundary scan development. Trained with Digital Test 6TL handler ICT and standalone MTS300. Program firmware inline on multi board panels for over 10 different customers with a single parallel using Uwharie test Solutions software. Support Teradyne 18XX systems. Use Jira software to manage engineering projects tasks for my ICT developments. Use Harvest, UKG, Dropbox and other software used at my system.

Sypris Electronics 10421 University Center Dr., Tampa, FL 33615, Senior Test Engineer,

1-2-2022 to 9-23-23

Perform the testability’s and boundary scan development using XJTAG for multiple projects. Some of these include complex, multi device programming. There are CCA’s with over 25 scan devices. Support Keysight 3070 ICT, SPEA 4060 Flying Probe, Seica Pilot M4 FP in production. Certified IPC Specialist. Supply quotes for ongoing projects for our customers.

SMTC Corp 425 North Dr. Melbourne, FL 32934, Senior Test Engineer

1-2-2021 to 1-1-2022

Support Keysight 3070 ICT and Seica Pilot V8 Flying Probe development and testing. Also perform the testability’s and boundary scan development using XJTAG. The front-end development for all the ICT and flying probe developments are done with Mentor/Valor Preparation Preparedness and DFT/DFM software. Use Factory Logics software for production control.

Astronics Test Systems 12889 Ingenuity Dr., Orlando, FL 32826, Senior Integration Engineer

1-1-2020 to 1-2-2021

I operated as a Test Lead for the NY rail system test system in which I led a team of test development engineers from both Bangalore India and Westford, MA. I supported program software in National Instruments TestStand and LabVIEW and developed and supported programs using XJTAG boundary scan.

Leonardo DRS 100 Babcock St., Melbourne FL, 32935, Senior Mfg. Test Equipment Engineer

1-2-2018 to 1-1-2020

Developed test strategies for over 10 family of defense related products with over 50 CCAs (Boards) at two contract manufacturing locations. Most of these products dealt with optics and portable computer defense platforms. Developed strategies for testing updated legacy platforms for next generation hardware. Deployed redesigned CCA test strategies which were integrated in functional test stations. Designed and implemented XJTAG and JTAG Technologies boundary scan testing and programming solutions into functional test stations and ICT to be used in high volume production board testing at the contract manufacturing locations in Melbourne and Idaho. Make test strategies decisions based on my over 20 years’ experience with both GR and HP ICTs, 6 years’ experience developing SPEA and Acculogic flying probe, over 10 years working with XJTAG, Corelis, Goepel, JTAG Technologies, Asset Interconnect boundary scan solutions and 3 years working with Cirris cable testing. I use my knowledge of National instruments LabVIEW, LabWindows as well as Atlas functional testing skills also as an asset. I use PDMLink, Omnify, and Deltek systems to perform my daily activities.

Spartronics 0167 Power Line Rd., Brooksville, FL 34602, Senior Test Engineer Lead

1-2-2013 to 1-1-2017

Senior test engineer in charge of support for flying probe (SPEA), in-circuit testing (Teradyne 1880, GR/Teradyne test station, Agilent/HP3070), Cable testing (Cirris) as well as boundary scan testing (Goepel). I support current production and new developments for board testing. Familiar with SPEA Leonardo XA and YA, Teradyne D2B, Test fixture development and Agile configuration systems and Aegis routing systems. Support current production for many functional testing including RF, assist in the bidding and proposals for contracts from new customers in the areas of Flying Probe, ICT, boundary scan, functional test, cable test, ESS and vibe. I support the department at factory production meetings and NPI in new Test developments and bidding.

IEC 1450 Mission Ave., NE, Albuquerque, NM, 87107, Lead Test Engineer IV

1-2-2010 to 1-1-2013

A Test Engineer IV in charge of all aspects of testing a high mix low volume defense contracting manufacturing operation. Among the areas of my test development and support are incircuit test, boundary scan, cable test, flying probe, functional bench and automated ATE and environmental testing (both ESS, and vibration). Write test programs for ICT (over 25 in 2011) and boundary scan (over 20 in 2011). I quoted and developed SOW for testing of numerous applications, developed test plans, procedures, and supported defense customers. Support and develop functional testing hardware and software. Provide testability (DFT) analysis to my company and customers. Recently I saved the company over $120,000 by developing in-house programming of board level test. Developed new test strategies to repair failed circuit cards with ICT, boundary scan and functional which saved our company tens of thousands. Built most of my own testset hardware, some ITAs, STA’s and test fixtures as well as supporting, maintaining and repairing equipment which I support. Left position to move close to FL family.

X Technologies 100 Sandau, Suite 300, San Antonio, TX 78216, Senior Test Engineer Analyst

1-2-2009 to 1-1-2010

(contract) Developed test programs and solutions for Lackland AFB to modernize test program sets for a satellite communication system. This contract has required me to create several DOD documents. My responsibilities involved the transfer of legacy tapes test data from HP-VEE test station running HP-UX to a CD in Windows

format. This required transferring the data by using a LINUX server to run the test software and transfer the data to a Windows readable format. Wrote a procedure and trained engineers to convert tapes to CDs. Since no source code was provided, we had to reverse engineer the testset by capturing the data via the I488 and VXI busses and rewriting these tests using SCPI commands useable by the VDATS Teradyne spectrum 9000 system LabWindows/CVI.

TES (for Northrop Grumman) Forbes Industrial Park, 7215 SW Topeka Blvd., Topeka, KS 66619, Test Eng. Mgr. 1-2-2008 to 1-1-2009

(contract) I managed a team of six test engineers. We performed functional testing and repair of printed circuit cards. Directed their activities and evaluated their work performance. Develop new test strategies for postal depot hardware repair with tools such as LabView for motor testing and flying probe, boundary scan for testing motherboards, various circuit cards assembles and power supplies

DRS-Technologies Inc., 246 Airport Rd. Johnstown, PA 15904, Senior CCA Test Engineer

1-2-2007 to 1-1-2008

My responsibilities included Corelis Boundary Scan and GenRad ICT program development for new products, as well as supporting other test strategies including LabWindows, functional test. Helped introduce Spectrum 9100 Teradyne as well as supported Teradyne 910 functional test and GenRad 2276 ICT systems. We manufacture and test RF, digital and wireless products from various defense contractors. Left position to get back into a managerial role.

EADS-NA Def. (Hill AFB for 309th Software Maintenance Wing) 7981 Georgia St. Hill AFB, UT Site Manager 1-2-2003 to 1-1-2007

I was a site manager for a team of 17 contract engineers who were responsible for re-hosting of legacy ATLAS Test Program Sets. We developed a new test station with the Teradyne Spectrum 9000 to replace aging E35E HP1000 based equipment for the test of LRU and SRU in the Minuteman Missile system. I also performed TPS re-hosting (test development). I developed 12 program tests for analog and digital circuit cards. I left this position when the contract was completed.

A.T.E-LM 5600 Sand Lake Rd., Orlando, FL 32819 Test Contract Engineer

1-2-2002 to 1-1- 2003

(contract) I was responsible for implementing JTAG testing for 8 digital circuit boards, which were used in the Comanche helicopter. These boards were designed almost 10 years previously, so I had to develop test fixtures for accessing

the JTAG chain and develop a unique connectorized external boundary-scan test strategy. This enabled me to complete this project with the highest possible test coverage. I left when the contract was completed ahead of schedule.

Marconi Communications 1000 Marconi Dr. Warrendale, PA 15086 Senior Test Engineer

1-2- 1999 TO 1-1-2002

My senior level responsibilities included developing manufacturing test strategies for many of Marconi’s leading edge network switches such as BXR ATM network equipment and other products. I managed the development of B/S (JTAG), ICT, X-Ray, and flying probe for our facility and our remote contract manufacturer locations. I have

been instrumental in the push to switch to (Agilent 5DX) X-Ray and (Corelis) JTAG testing in order to test our boards that range from 7,000 – 25,000 nodes. Through this process we have been able to greatly reduce our costs while increasing test coverage (1.2 million in savings). I have worked on my company’s international test committee, which has standardized all locations on a test approach using National Instrument’s Test Stand for functional testing and Corelis for B/S testing. My employer has sent me to the U.K., Canada and Germany in order to educate, train and assist in the development of board test strategies for our remote facilities. I have given presentations to test conferences both here and abroad about our test methods and experiences. I trained several test engineers on boundary scan test development. I was laid off from this position when Marconi went into bankruptcy.

3Com Corporation 3930 West Parkway Blvd., Salt Lake City, UT 84120 Test Support Supervisor

1-2-1998 to 1-1-1999

Responsible for managing third shift test support for eight high volume production lines. We supported many HP

3070 systems with in-line (using board handlers) and offline capabilities, functional modem testing, and many other functional PC based platforms. I trained production operators and test engineers on the support, maintenance and operation of ICT and functional tests. I left when our factory was sold to Manufacturers Unlimited.

TRW Automotive (ZFW) 902 S 2nd St. Marshall, IL 62441 Senior Test Engineer

1-2-1997 to 1-1-1998

I was responsible for the 3rd generation Chrysler airbag electronic modules’ incircuit test. Wrote and debugged programs for several new products, which used priority protocols to data load electronic modules. Helped setup several incircuit test systems and support high volume production using conveyors with Phillip board handlers on many different incircuit test lines.

Lucent Technologies (AT&T, Bell Labs) 1 Mansfield Rd. Shreveport, LA 71118 MTS

6-4-1980 to 1-1-1997

Developed ICT for large production, high volume facilities, supported automation (board handlers and Philips ICT handles. Present several papers at various user and company groups. Trained technicians and test engineers on ICT and handling systems. Developed ICT test fixtures and performed repairs on these fixtures. Developed device test models in C++.

EDUCATION

Keller Graduate School – MBA Project Management, 6 hours completed 2007

Sandy, UT (MBA program) (GPA 4.0/4.0)

Purdue University – Masters Industrial Engineering, 6 hours completed 1996 - 1996

West Lafayette, IN (Lucent summer on campus program) (GPA 3.0/4.0)

Bachelor of Science Degree in Organizational Management 1993 - 1995

Wiley College, Marshall, Texas (GPA 3.1/4.0) 0

Associate Degree of Science in Electronics Technology 1978 - 1980

Vincennes University, Vincennes, Indiana (GPA 3.35/4.0)

TRAINING

SPEA FP development, NI LabWindows/CVI, ATLAS functional test system overview, PAWS AN/GSM-315A programming language training, CMMI training, ITAR, Corelis B/S, Goepel B/S, introduction to Acculogic B/S training, ASSET Intertech B/S, HP 3070 Maintenance Class and Phillips board handler maintenance class, GenRad

227x/228x training, Teradyne 18XX, Teradyne D2B, HILO simulation, Analog and Digital Library, System administration schools in UNIX, DEC, and Windows environments. Worked with C, C++, basic and wrote macro’s in ED2, Microsoft Office (Word, Excel, PowerPoint). Attended GenRad test conferences (1984, 86,88,91,97,98). Presented papers at GenRad test conferences (1988,91 and 98). Attended QS 9000 and ISO9001 training at Lucent and TRW. Presenter at Agilent’s 5DX and ICT conferences in Spring and Summer of 2000, presented AWARE Test presentation at Marconi’s global Test Conference and head up a test committee on test standards in Coventry U.K. and Offenburg Germany. Attended Boundary Scan Test Development/Diagnostics Repair Workshop and Advanced Test Development classes for Acculogic, Corelis, XJTAG and Goepel boundary scan.

CERTIFICATIONS

Certified IPC Specialist IPC J-STD-001

Certified IPC Specialist IPC-A-610

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