SUMMARY OF QUALIFICATIONS
Ambitious, result-oriented, and innovative PhD. Engineer/manager with excellent management skills and extensive experience in various aspects of semiconductors, circuits, and systems. Expertise in the areas of telecommunication system design, optimization, characterization, reliability, diagnostic and failure analysis of semiconductor electronics, circuits, and related communication systems.
PROFESSIONAL ACCOMPLISHMENTS AND EXPERIENCE
Gerson Lehrman Group, New York, NY 2015 – Present
Technology Consultant, Network & Security Services, and Open Virtual Platforms
Provide technology consultation to wired and wireless telecommunication networks, Internet of Things, and network availability (power, signal, access) related markets to GLG clients worldwide. Provided Market and Supply Chain directives for Capital Expenditure items. Analyzed network availability, reliability, and compliance to telecommunications, utilities, healthcare, and transportation market clients of GLG.
Arukona, Wichita, KS 2018- 2019
Co-Founder & COO
Led a team of high-performing professionals to be efficient, productive, and effective. Oversaw company operations and employee productivity while building a highly inclusive culture ensuring team members thrive and organizational outcomes are met.
Adhere to company, federal, state, and local business requirements, enforcing compliance and taking action when necessary.
Aggressively managed capital investment and expenses to ensure the company achieved investor targets relative to growth and profitability
Established various Telecommunication standard compliance and certifications to achieve carrier grade and Federal emergency management and homeland security level compliance of Arukona wireless telecommunication systems.
Ulterius Technologies, Wichita, KS 2011 - 2018
Co-Founder & Director, Quality & Reliability
Developed corporate quality & reliability process. Established industry compliancy process to align industry level quality & reliability requirements such as NEBS, Telcordia, ISO, TL, RTCA/DO, etc. with internal Ulterius Technologies’ quality & reliability requirements.
Led a diverse set of international team of technology, quality, and compliance engineers to deliver a state of the art Telecommunication network equipment under budget, on time, and with zero defects
Completed New Product Introduction (NPI) and Automated Manufacturing Systems (AMS) of 9 separate Telecommunication network equipment within 90 days from initial development.
ALCATEL-LUCENT, Wichita, KS 1997 - 2011
System Reliability Engineer, Bell Labs Central Technical Organization 2006 - 2011 Developed and implemented Qualification and certification Policies for component and system qualifications including NEBS, ITU-T, IEEE, and 3GPP for Alcatel-Lucent. Worked with hardware and software design teams, data center and utility substation teams to establish and implement end-to-end common Design for reliability Strategy that ensures customers’ trust and value as well as their network uptime. Responsible for establishment of reliability requirements and targets, modeling, critical component analysis for all ALU products. Responsible for the expeditious root cause analysis of critical customer or revenue impacting issues. Represented ALU in various standard organizations such as JEDEC, Telcordia, ITU-T, and IEEE as core committee member.
Member of Technical Staff, Corporate Reliability Team 2002 – 2006
Developed and implemented qualification policies for component and system qualification across the corporation. Performed Bill Of Materials analysis for systems and critical circuit packs to identify critical component and develop qualification plan and mitigate potential reliability risks. Responsible for critical device qualification for Processor, FPGA, DSP, Telecom/Datacom technologies.
Reliability Engineer, Supply Line Engineering 1997 - 2002
Developed and drove corporate-wide semiconductor component strategy. Provided leadership and expertise in component quality and reliability to Bell Labs advanced research and Lucent OEM departments that impacted positively on absolute customer satisfaction. Managed Lucent supplier Qualification Program, Partnership Qualification Program, and Reliability Monitoring Program for all semiconductor commodities.
Kansas State University, Manhattan, KS 1989 - 1997
Graduate Research & Teaching Assistant
July ‘90 - May ‘97: Graduate Research Assistant, Dept. of Elec. Eng.
Jan ‘95 - May ‘97: Instructor, Electronics I, Dept. of Elec. Eng.
Aug ’93 – Dec ’94: Instructor, Calculus, Dept. of Mathematics
Jan ’93 – May ’93: Instructor, Engineering Physics, Dept of Physics
Jan ‘92 - Dec ‘92: Instructor, Integrated Circuit Design Lab, Dept. of Elec. Eng.
Aug ‘91 - Dec ‘91: Instructor, Electrical Engineering Lab I, Dept. of Elec. Eng.
Jan ’91 – July ’91: Instructor, Engineering Physics, Dept of Physics
Aug ‘90 – Dec ‘90: Instructor, VLSI Design Lab, Dept. of Elec. Eng.
Jun ’89 – Jun ’90: Instructor, Algebra II and Calculus, Dept. of Mathematics
Jan ‘87 – May ‘89: Instructor, Engineering Physics Lab, Dept. of Physics
Doctor of Philosophy: Electrical Engineering, Kansas State University, May 19997.
Dissertation Subject: Electrical characterization of SiC semiconductor and SiC-SiO2 Interfaces
Master of Science: Electrical Engineering, Kansas State University, July 1992.
Thesis Subject: Electrical properties of thermally grown SiC- SiO2 Interfaces.
Master of Science: Solid State Physics, Kansas State University, July 1989
Thesis Subject: Preparation and characterization of Y- and Bi-based bulk and thin film superconductors
Bachelor of Science: Physics, Indian Institute of Technology, Kharagpur, India, July 1986
Member of JEDEC committee representing Alcatel –Lucent for JC-14 and JC15, Aug 1997-Present.
IEEE Solid State Physics Society, July 1992-Present
Associate Member, The Institute of Electrical and Electronics Engineers, July1989- Present
Associate Member, Electronics Discharge Association, July 1992- Present
PUBLICATIONS & PROCEEDINGS
N.N.Singh, K. Stuchlik “Semiconductor Reliability in 22nm process structure and beyond,” Alcatel-Lucent PDC& Reliability Joint Study, October 2012
N.N.Singh, A. Cavgalar, K. Stuchlik “Metalgate transistors and High-K dielectric structure in 28nm process,” Alcatel-Lucent PDC& Reliability Joint Study, April 2010
N.N.Singh, A. Cavgalar, K. Stuchlik “32nm process node analysis and Reliability Estimation,” Alcatel-Lucent Reliability Report, April 2009
N.N.Singh, A. Cavgalar, K. Stuchlik “45nm process node analysis and Reliability Estimation,” Alcatel-Lucent Reliability Report, March 2008
N.N.Singh, A. Cavgalar, R.Richmond, K. Stuchlik “65nm process node analysis and Reliability Estimation,” Lucent SCN & Reliability Report, February 2007
N.N.Singh, A. Cavgalar, R.Richmond, K. Stuchlik “90nm process node analysis and Reliability Estimation,” Lucent SCN & Reliability Report, April 2005
N.N.Singh, A. Cavgalar, R.Richmond, K. Stuchlik “130nm process node evaluation analysis,” Lucent SCN & Reliability Report, Feb 2003
N.N. Singh and A. Rys, “C-V Characteristics of Thermally Oxidized 6H-SiC at high Temperature,” Proceeding of the 3rd International High Temperature Electronics Conference, June 1996.
A. Rys, N. Singh and M. Cameron, “Modeling and Characterization of Thermally Oxidized 6H Silicon Carbide,” Journal of the Electrochemical Society, April 1995.
N.N.Singh and A. Rys, “Electrical Properties of Thermally Oxidized Silicon Carbide Semiconductors,” Proceedings of the International Conference on Silicon Carbide and related Materials, 1994.
N.N. Singh and A. Rys, “Thermal Oxidation and Electrical properties of SiC MOS Structure,” Journal of Applied Physics, February 1993.
A.U. Ahmed, A. Rys, N. Singh, J.H. Edgar, and Z.J. Yu, “The Electrical Compositional properties of AlN-Si Interfaces,” Journal of the electrochemical society, April 1992.
N. Singh, A. Rys, and A.U. Ahmed, “Electrical Properties of Thermally Grown SiO2-SiC Interfaces,” Material Rec. Soc. Symp. Proceedings, 1992.
S. Thomas, N. Singh, A. Al-Sharif, P.M.A. Sherwood, and M.J. O’Shea, “Superconductivity and Electronic Structure of Bi-Based Compounds,” Physical Review B, April 1989.