**** ****** ***.

McFarland, WI *****

Phone #: 608-***-****

Email: ad1khs@r.postjobfree.com

DAVID S. GRIERSON, PH.D.

EDUCATION

Ph.D., 2008, Engineering Mechanics, University of Wisconsin-Madison B.S., 2002, Mathematics with Physics minor, University of Wisconsin-Whitewater PROFESIONAL APPOINTMENTS

Co-founder of systemech, Inc, 2017-Present, Madison, WI

-Developing innovative and scalable manufacturing equipment and processes for assembly of flexible hybrid electronics

Visiting Associate Scientist, 2016-2019, Engineering Physics Dept., UW-Madison

-Performing experimental research on high-temperature tribology of structural superalloys in helium gas-cooled reactor environments within the Nuclear and Applied Materials Research group of Professor Kumar Sridharan

Visiting Associate Scientist, 2014-2015, Materials Science Dept., UW-Madison

-Developed protocols for measuring friction and wear properties of silicon carbide using atomic force microscopy within the computational materials group of Professor Izabela Szlufarska

Independent Contractor, 2013-2014, Materials Science Dept., UW-Madison

-Developed protocols for measuring friction and wear properties of silicon carbide using atomic force microscopy within the computational materials group of Professor Izabela Szlufarska

Assistant Visiting Scientist, 2012-2013, Engineering Physics Dept., UW-Madison

-Performed research on high-temperature creep crack growth in structural superalloys within the solid mechanics laboratory of Professor Wendy Crone

Co-founder of systeMECH, LLC, 2010-2017, Madison, WI

-Developing innovative and scalable manufacturing equipment and processes for assembly of flexible hybrid electronics

Postdoctoral Researcher, 2008-2011, Mechanical Engineering Dept., UW-Madison

-Performed research on surface and interface mechanics problems in scanning probe microscopy and semiconductor manufacturing processes under the advisement of Professor Kevin Turner

Graduate Research Assistant 2002-2008, Engineering Mechanics Dept., UW-Madison

-Performed research on the fundamental aspects of nanoscale adhesion and friction of hard carbon thin films under the advisement of Professor Robert Carpick

Undergraduate Researcher, 2001, Electrical Engineering Dept., UW-Madison

-Performed research in a microfluidics laboratory with the REU (Research Experience for Undergraduates) program under the advisement of Professor Amit Lal INSTUMENTATION AND TECHNICAL EXPERIENCE

Ambient and UHV atomic force microscopy (AFM)

Microscale tribometry

High-temperature tribology

Nanoindentation

Scanning electron microscopy (SEM) and transmission electron microscopy (TEM)

X-ray photoelectron spectroscopy (XPS) and Auger electron spectroscopy (AES)

Near-edge x-ray absorption fine-structure spectroscopy (NEXAFS), using synchrotron radiation

Photoelectron emission microscopy (PEEM), using synchrotron radiation

Raman spectroscopy

Optical profilometry

Surface modification with radio-frequency plasma and hot filament CVD

Clean room fabrication

Wet chemistry work with acid etching and cleaning (including HF, HNO3, and H2SO4)

Electric discharge machining

CNC milling

Creep crack growth (CCG) testing

Tensile and hardness testing

Finite element modeling and analysis

Software: Matlab, LabVIEW, COMSOL, SOLIDWORKS, AutoCAD, ABAQUS, Mathematica, Maple, Kaleidagraph, Origin, IGOR, Photoshop

Writing, editing, and publishing technical papers PUBLICATIONS

34. High-Temperature Tribological Behavior of Structural Materials after Conditioning in Impure-Helium Environments for High-Temperature Gas-Cooled Reactor Applications V. Pauly, C. Tesch, J. Kern, M. Clark, D. Grierson, D. Singh, O. Ajayi, and K. Sridharan, Journal of Nuclear Materials 522, 2019, p. 311

33. Mechanical Properties of Structure-Tunable, Vapor-Deposited TPD Glass C. Tangpatjaroen, K.Bagchi, R. Martínez, D. Grierson, I. Szlufarska Journal of Physical Chemistry C 122(48), November, 2018 32. Tribochemical Wear of Diamond-Like Carbon-Coated Atomic Force Microscope Tips J. Liu, Y. Jiang, D. S. Grierson, K. T. Turner

ACS Applied Materials & Interfaces, September, 2017 31. Size dependence of nanoscale wear of silicon carbide Tangpatjaroen, Chaiyapat; Grierson, David; Shannon, Steve; Jakes, Joseph ; Szlufarska, Izabela ACS Applied Materials & Interfaces, 9, 2, 1929-1940, January, 2017 30. Creep Crack Growth Behavior of Alloys 617 and 800H in Air and Impure Helium Environments at High Temperatures

Grierson, D.; Cao, G.; Brooks, P.; Pezzi, P.; Glaudell, A.; Kuettel, D.; Fisher, G.; Allen, T.; Sridharan, K.; Crone, W.C.

Metallurgical and Materials Transactions E, November, 2016 29. Rolling-based direct-transfer printing: A process for large-area transfer of micro- and nanostructures onto flexible substrates

D. S. Grierson, F. S. Flack, M. G. Lagally, K. T. Turner Journal of Applied Physics, v 120, n 9, September, 2016 28. Experimental Method for Creep Crack Growth Testing in Controlled Environments at High Temperatures

Grierson, D.; Cao, G.; Brooks, P.; Pezzi, P.; Glaudell, A.; Kuettel, D.; Fisher, G.; Allen, T.; Sridharan, K.; Crone, W.C.

Experimental Mechanics, v 55, n 2, p 417-426, 2015 27. Creep Crack Growth in High-Temperature Impure Helium Environments Grierson, D.; Cao, G.; Glaudell, A.; Kuettel, D.; Fisher, G.; Pezzi, P.; Brooks, P.; Allen, T.; Sridharan, K.; Crone, W.C.

Conference Proceedings of the Society for Experimental Mechanics Series, v 66, n v 5, p 203- 209, 2015

26. Flat punch adhesion: Transition from fracture-based to strength-limited pull-off Jiang, Yijie; Grierson, David S.; Turner, Kevin T. Journal of Physics D: Applied Physics, v 47, n 32, August, 2014 25. Interface mechanics of adhesiveless microtransfer printing processes Kim-Lee, H.-J.; Carlson, A.; Grierson, D.S.; Rogers, J.A.; Turner, K.T. Journal of Applied Physics, v 115, n 14, April, 2014 24. An apparatus for creep crack growth testing in controlled environments at high temperatures Grierson, D.; Cao, G.; Brooks, P.; Pezzi, P.; Glaudell, A.; Kuettel, D.; Fisher, G.; Allen, T.; Sridharan, K.; Crone, W.C.; Fisher, G.

Conference Proceedings of the Society for Experimental Mechanics Series, v 7, p 65-71, 2014 23. Simulated adhesion between realistic hydrocarbon materials: Effects of composition, roughness, and contact point

Ryan, Kathleen E.; Keating, Pamela L.; Jacobs, Tevis D. B.; Grierson, David S.; Turner, Kevin T.; Carpick, Robert W.; Harrison, Judith A.

Langmuir, v 30, n 8, p 2028-2037, March, 2014

22. Mechanics of interaction and atomic-scale wear of amplitude modulation atomic force microscopy probes

V. Vahdat, D. S. Grierson, K. T. Turner, and R. W. Carpick ACS Nano, 7, pp. 3221-3235,April, 2013

21. An Apparatus for Creep Crack Growth Testing in Controlled Environments at High Temperatures

D. Grierson, G. Cao, P. Brooks, P. Pezzi, A. Glaudell, D. Kuettel, G. Fisher, T. Allen, K. Sridharan, W.C. Crone

Proceedings of the 2013 SEM Annual Conference and Exposition on Experimental and Applied Mechanics, 350, p. 1-8, June, 2013

20. The effect of atomic-scale roughness on the adhesion of nanoscale asperities: A combined simulation and experimental investigation

Jacobs, Tevis D. B.; Ryan, Kathleen E.; Keating, Pamela L.; Grierson, David S.; Lefevr, Joel A.; Turner, Kevin T.; Harrison, Judith A.; Carpick, Robert W. Tribology Letters, v 50, n 1, pp 81-93, April 2013 19. Adhesion of nanoscale asperities with power-law profiles Grierson, David S.; Liu, Jingjing; Carpick, Robert W.; Turner, Kevin T. Journal of the Mechanics and Physics of Solids, v 61, n 2, p 597-610, February, 2013 18. Influence of surface passivation on the friction and wear behavior of ultrananocrystalline diamond and tetrahedral amorphous carbon thin films A. R. Konicek; D. S. Grierson; A. V. Sumant; T. A. Friedmann; J. P. Sullivan; P. U. P. A. Gilbert; W. G. Sawyer; R. W. Carpick

Physical Review B, 85, 155448 April, 2012

17. Advances in Manufacturing of Molded Tips for Scanning Probe Microscopy Moldovan, Nicolaie; Dai, Zhenting; Zeng, Hongjun; Carlisle, John A.; Jacobs, Tevis D. B.; Vahdat, Vahid; Grierson, David S.; Liu, Jingjing; Turner, Kevin T.; Carpick, Robert W. Journal of Microelectromechanical Systems, v 21, n 2, p 431-442, April, 2012 16. “Soft Si”: Effective Stiffness of Supported Crystalline Nanomembranes Francesca Cavallo, D. S. Grierson, K. T. Turner, and M. G. Lagally ACS Nano, n 7, p 5400-5407, July 26, 2011

15. Characterization of Hysteresis of Surface Energy in Room-Temperature Direct Bonding Processes

David Grierson and Kevin T. Turner

ECS Trans., v 33, n 4, p 573-580

14. Preventing nanoscale wear of atomic force microscopy tips through the use of monolithic ultrananocrystalline diamond probes

J. Liu, D.S. Grierson, N. Moldovan, J. Notbohm, S. Li, P. Jaroenapibal, S.D. O’Connor, A.V. Sumant, N. Neelakantan, J.A. Carlisle, K. T. Turner, R. W. Carpick Small, v 6, n 10, p 1140-1149, 2010

13. Thermal stability and rehybridization of carbon bonding in tetrahedral amorphous carbon D. S. Grierson, A.V. Sumant, A.R. Konicek, T.A. Friedmann, J.P. Sullivan, and R. W. Carpick Journal of Applied Physics, v 107, n 3, p 033523, 2010 12. Assessment of the mechanical integrity of silicon and diamond-like carbon coated silicon atomic force microscope probes

Liu, Jingjing; Grierson, David S.; Sridharan, Kumar; Carpick, Robert W.; Turner, Kevin T. Proceedings of SPIE - The International Society for Optical Engineering, v 7767, 2010 11. Characterization of Microscale Wear in a Polysilicon-Based MEMS Device using AFM and PEEM-XANES Spectromicroscopy

D.S. Grierson, A. V. Sumant, A.R. Konicek, G.E. Wabiszewski, M.P. de Boer, A.D. Corwin, and R.W. Carpick

Tribology Letters, v 36, n 3, p 233-238, 2009

10. Origin of ultralow friction and wear in ultrananocrystalline diamond A. R. Konicek, D. S. Grierson, P.U.P.A. Gilbert, W.G. Sawyer, A.V. Sumant, and R. W. Carpick

Physical Review Letters, v 100, n 23, p 235502-1-4, 2008 9. Synthesis and characterization of smooth ultrananocrystalline diamond films via low pressure bias-enhanced nucleation and growth

Y.C. Chen, X.Y. Zhong, A. Konicek,D.S. Grierson, N.H. Tai, I.N. Lin, B. Kabius, J.M. Hiller, A.V. Sumant, R.W. Carpick, O. Auciello

Applied Physics Letters, v 92, n 13, p 133113-1-3, 2008 8. Nanotribological properties of nanostructured hard carbon thin films D. Grierson

Article, January 2008

7. Surface chemistry and bonding configuration of ultrananocrystalline diamond surfaces and their effects on nanotribological properties

A. V. Sumant, D. S. Grierson, J. E. Gerbi, J. A. Carlisle, O. Auciello, and R. W. Carpick Physical Review B, 76, 235429, December, 2007

6. Nanotribology of carbon-based materials

D. S. Grierson, R. W. Carpick

Nano Today, v 2, n 5, p 12-21, 2007

5. Tribochemistry and material transfer for the ultrananocrystalline diamond-silicon nitride interface by X-PEEM spectromicroscopy

David S. Grierson, Anirudha V. Sumant, Andrew R. Konicek, Mike Abrecht, J. Birrell, Orlando Auciello, John A. Carlisle, Thomas W. Scharf, Michael T. Dugger, P.U.P.A. Gilbert, and Robert W. Carpick

Journal of Vacuum Science & Technology B (Microelectronics and Nanometer Structures), v 25, n 5, p 1700-5, 2007

4. Small amplitude reciprocating wear performance of diamond-like carbon films: dependence of film composition and counterface material

J.A. Bares, A.V. Sumant, D.S. Grierson, R.W. Carpick, and K. Sridharan Tribology Letters, v 27, n 1, p 79-88, 2007

3. Surface composition, bonding, and morphology in the nucleation and growth of ultra-thin, high quality nanocrystalline diamond films

A.V. Sumant, P.U.P.A. Gilbert, D. S. Grierson, A.R. Konicek, M. Abrecht, J.E. Butler, T. Feygelson, S.S. Rotter, R.W. Carpick

Diamond and Related Materials, v 16, n 4-7, p 718-24, 2007 2. Toward the ultimate tribological interface: Surface chemistry and nanotribology of ultrananocrystalline diamond

A.V. Sumant, D.S. Grierson, J.E. Gerbi, J. Birrell, U.D. Lanke, O. Auciello, J.A. Carlise, R.W. Carpick

Advanced Materials, v 17, n 8, p 1039-1045, 2005

1. Accounting for the JKR-DMT transition in adhesion and friction measurements with AFM Grierson, D.S.; Flater, E.E.; Carpick, R.W.

Journal of Adhesion Science and Technology, v 19, n 3-5, p 291-311, 2005 PATENTS

US Patent P120088US01 - System for transfer of nanomembrane elements with improved preservation of special integrity (co-inventor)

US Divisional Patent (pending) - System for Transfer of Nanomembrane Elements with Improved Preservation of Spatial Integrity (co-inventor)

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