Engineer Support

Don Myers

Phoenix, AZ ***** 623-***-****

https://www.linkedin.com/in/donald-myers-5472b0112 ***********@*****.***

Summary

Collaborative problem solver who uses a variety of physical analysis to determine the root cause of electronics failures, and follows up with the appropriate supplier or customer to provide a corrective action.

Expert at identifying root cause of issues and translating complex defects into clear, understandable and actionable steps. Expertise in:

Non-destructive physical analysis

Destructive physical analysis

Specifications and the applications to products

Process Certification

Use of electronic test and measurement equipment.

Professional Experience

UNITED TECHNOLOGIES AEROSPACE SYSTEMS (Hamilton Sundstrand) 2006 – Nov, 2015

Phoenix, AZ

Senior Engineer, Test and Reliability

Provided analysis of defective electronic and electro-mechanical components used in Aerospace equipment (both pre and post-certification hardware). This included sub-component level analysis of components to determine the root cause of the test failures encountered during OEM builds and field returns. Parts were electrically verified with various electronic test equipment, including PXI based (LabVIEW/NI Signal Express) testers, oscilloscopes, signal generators, etc. in order to verify device functionality. The part was then physically examined by using external visual, Particle Impact Noise Detection, Scanning Electron Microscopes, Acoustic Microscopy, real-time X-ray inspection and then the devices were opened to examine the interiors of the devices to determine whether there was a latent defect, or if the part was a customer induced failure or required an engineering change. Was also the technical lead for the Process Certification program at the plant site. This uses statistical methods to reduce the variation of different processes used to construct the units that UTAS builds.

Provided analysis to suppliers so that they can produce defect free products due to internal manufacturing defects due to hand placement of dice in diodes. This created an opportunity for the supplier to create hi-rel diodes, with fewer returns.

Analysis to internal customers proved that the unit manufacturing processes did cause the defects with the improper usage of the cleaning process due to moisture intrusion. This eliminated rework due to leakage currrent in non-hermetic transformers.

Certified 5 manufacturing processes to eliminate special cause defects in board manufacturing and machining. All process were certified with a Cpk of greater than 1.33.

Proved that improper soldering techniques were responsible for multiple field failure of ceramic caps. This virtually eliminated the warranty returns for this type of failure.

Recommended purchasing of capital equipment in order to reduce the reliance of external failure analysis. With an in-house CSAM system, the cost to analyze the components externally was eliminated, saving approximately $50,000 per year

HAMILTON SUNDSTRAND, Phoenix, AZ 2002 – 2006

Senior Test Technician, In-Circuit Test

Provided test programming and support for in-circuit testing of complex PCB's at Hamilton Sundstrand using the GenRad 228x and 227x line of testers. This included testing and repair of production boards. This also included support for the Flying Scorpion flying prober tester. Responsibilities included making software changes for engineering and production changes, and documentation of test programs, and creating development software for new prototypes.

Eliminated the need to have off-site engineering support come into the plant to do programming or process changes.

With the experience at GenRad, was able to repair all the inoperative spare PCBs, saving over $100,000 in cost to send the boards to be repaired.

ACT MANUFACTURING, Hudson, MA 2001

In-Circuit Engineer

Provided test program generation and support for in-circuit testing of complex PCB's at ACT Manufacturing using the GenRad 228x line of testers. This included creation of test sets from CAD data through interpretation of test results. Test techniques included the standard in-circuit test techniques, as well as boundary scan / JTAG testing, In System Programming (ISP) of programmable parts, and vector-less test techniques (Junctions / Opens Xpress). This also included providing customers with a design for testability review in order to increase yield.

GenRad Inc, Concord, MA 1996-2001

Senior Applications Engineer

Provided telephone support of the customer base in programming techniques and operation of the 228x, Viper, and 227x in-circuit testers. This included programming, optimization, operating system support and program analysis. Provided consultation and telephone training in all aspects of creating test sets, from importation of CAD data through interpretation of the test results. Operating system support includes RSX, VMS, SCO UNIX, and Windows NT.

Consultant, Production Solutions International, GenRad, Inc 1995-1996 Visited customers on-site in order to streamline and support the production line with regards to in-circuit test and applications. This included optimizing test sets and troubleshooting problems further up the line, which the in-circuit tester indicated. This included both the 228x and 227x testers.

Senior Application Engineer, GenRad 1990-1995 Supported the customer base via telephone and on-site visits in all aspects of programming and operation of the 228x and 227x product line, as well as operating system support.

Test Engineer, GenRad 1987-1990 Provided manufacturing with support of the in-circuit and functional test of the products produced by GenRad. This included in-circuit test and functional programming of the GenRad 227x and 228x product line.

Test Technician, GenRad 1984-1987 Tested and repair of the GenRad GR16/GR18 VLSI testers. This included functional and system level diagnosis and repair of new systems.

Education

Bachelors of Science, Electronic Engineering Technology (BSEET), DeVry University, GPA: 3.8, President’s List, Dean’s List

Professional Development

C Programming, Northeastern University, Boston, MA

SCO UNIX System Administration, Boston University, Location

Supporting Windows NT, Microsoft Crop.

CBTest, Inspection Process, 228x, 227x, HILO, GR16 programming, GenRad, Process Certification (through UTC)

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