Paul (Doo-Hyun) Yoon

Sunnyvale, CA, ***** USA • 408-***-**** • acu6jq@r.postjobfree.com

VISA STATUS : Permanent resident (Green card)

CAREER SUMMARY

-PhD in Automation Engineering

-Various experiences in optical engineering (Zemax, optical bench experiment, optics design and implementation for inspection and metrology, optical sensors, precision mechanics)

-Strong fundamentals in Automation Engineering (C/C++, MEMS, Machine vision, real-time control)

-Multi-disciplinary team management possessing 13-year experience

-Supplier management possessing 5-year experience (tool design, process flow, equipment selection, DFM, and DOE proposals)

-PCB/Wafer/LCD/LED/OLED inspection and measurement machine development possessing 13-year experience

-Highly motivated, detail oriented, forward-thinking team player

ACADEMIA

Stanford University, Stanford, CA Feb. 2011 – Sep. 2014

-Visiting scholar in Ginzton Laboratory

-Research field : Fast AFM (Atomic Force Microscope)

Inha University, Korea Aug. 2000 – Aug. 2008

-PhD in Automation Engineering

-Dissertation : 3D precision measurement of scanning Moiré using line scan camera and large aperture lens

Kookmin University, Korea Mar. 1992 – Feb. 1998

-BS and MS in Mechanical Design Engineering (Concentration in plastic deformation process)

EXPERIENCE

Principal research engineer, LG Electronics – Pyung-tek, Korea Nov. 2014 – Present

-Overlay : Achieved 10 nm repeatability with 1 μm optical resolution using Visual C++, and robust optics. Developed 3 kinds of POLED in-line measurement equipment with this technology

-Metal inkjet printing machine : Optimized vision alignment speed by 3 times modifying vision software and optimizing motion control parameters. Achieved logically highest ink jetting speed applying time delay integration concept.

-Environmental Scanning Electron Microscope : Developed submicron precision auto focus function and electrostatic safety sensor.

-MEMS RF sensor and sensor block : Accomplished MEMS RF device design, fabrication, simulation and characterization. And also developed sensor block to accommodate nanometer precision device as a part of mass production LCD TFT noncontact pattern inspection equipment. Achieved 5 times finer resolution of 10 μm.

Visiting scholar, Stanford University – Stanford, CA Feb. 2011 – Aug. 2014

-Fast AFM (Atomic Force Microscopy) system : Developed 40X faster AFM sensor and system (design/modeling/fabrication/characterization)

-Achieved 1 tap calculation, 1/4X sample damage, 19X sensitivity

-Implemented data acquisition using Visual C++ and LabVIEW FPGA

-Advisor : Olav Solgaard, Professor of Electrical Engineering

Chief Technology Officer, Advanced Technology Inc., Korea Mar. 1998 – Feb. 2011

-Optical 3D measurement and nano-scale repeatability stage : Developed high speed 3D measurement technology using 12k line scan camera for Projection Moiré system : lateral resolution 2.5 micron, FOV 20 mm, measurement repeatability 1 micron@3σ, measurement time 2.4 min/300 mm wafer (fastest in the world).

-300 mm Wafer optical inspection machine : Developed inspection machines including dicing line inspection, front-end macro inspection, back-end macro inspection, bump height inspection

-Components : Developed AF sensor module, illuminations and inspection algorithms using Visual C++. Filed patents of AF sensor module, and illuminations

-Gerber RS274X data display and image printing software development for its geometry recognition

-29 kinds of PCB inspection machines

SKILLS

-Instruments : WSI, Ellipsometor, Profiler, Confocal microscope, Oscilloscope, Acousto-optic deflector, Galvano mirror, Stabilized He-Ne laser, Gratings, Piezo actuator, FPGA real-time control, Mach-Zehnder interferometer, Auto focus sensor, Lens, Illuminations, Atomic Force Microscope, 3D sensor, Machine vision hardware design and implementation.

-Simulation : COMSOL, L-Edit, ANSYS HFSS, CREO 2.0 simulation

-Programming : LabVIEW FPGA (prior experience), OpenMP, OpenCV, IPP (prior experience), C++ object oriented programming (expertized), Visual C++ (expertized), Borland C++, MFC (expertized), MIL (prior experience), Parallel programming (expertized), Computer Vision and Machine Vision programming (expertized). Computational geometry (prior experience)

AWARDS

-Committee member of National Evaluation Program of Technology, 2010–2011, Korea Institute of S&T Evaluation and Planning (KISTEP)

-Jang-Young-Shil Award, 2010, Korea Industrial Technology Association (KOITA), awarded by Korean minister (Ministry of Education and Science Technology)

-Grand prix of Science and Technology Awards of Inchon city 2009

-Certification of "New Excellent Technology 2009”, Korea Industrial Technology Association (KOITA), awarded by Korean minister (Ministry of Knowledge Economy)

PATENTS

-Doo-Baeck An, Doo-Hyun Yoon, “Wafer defect high speed inspection apparatus”, Korea patent 102**********, 28 Nov 2012

-Doo-Hyun Yoon, Hyun-Ju Kim, “Moire measurement apparatus using cylinder lens”, Korea patent 100**********, 2 Mar 2010

-Doo-Baeck An, Doo-Hyun Yoon, Hyun-Ju Kim, “Scanning Moire measurement method using convergent illumination system”, Korea patent 100950590, 24 Mar 2010

-Doo-Hyun Yoon, Hyun-Ju Kim, “Table movement mechanism for Moire 3-D image acquisition system”, Korea patent 100909583, 21 July 2009

-Doo-Hyun Yoon, Hyun-Ju Kim, “Scanning Moire measurement device and method”, Korea patent 100856466, 28 Aug 2008

-Doo-Hyun Yoon, In-Kyung Park, “Apparatus and method for PCB pattern inspection”, Korea patent 100609107, 27 July 2006

-Doo-Hyun Yoon, In-Kyung Park, “Apparatus and illumination system for metal and PSR surface inspection of PCB, Korea patent 200384722, 11 May 2005

-Myung-Chae Jung, Doo-Baeck An, Doo-Hyun Yoon, “Inspection module for thin filmed raw material of wafer, Korea patent 200332371, 28 Oct 2003

-And 9 patents registered in Korea

Contact this candidate