Technician Field Service

JORGE NEYRA

SUMMARY OF QUALIFICATIONS

Has over ten years of experience as a test technician for medical, and aerospace industries

Demonstrates expertise in building, troubleshooting, documenting, and modifying test fixture systems, as well as performing root cause failure analysis

Proven skills in setting, calibrating, maintaining, and ordering of test equipment

Knowledgeable in reading and interpreting blueprints, drawings, and schematics

Proficient in utilizing mechanical, environmental, and electronic test equipment such as: Material Pull tester, Calipers, Temperature/Humidity ovens, Multimeter, etc.

EDUCATION

Electronic Technology – DeVry University

Electronic Technician – Metropolitan Institute

High School Diploma – Meliton Carbajal High School

COMPUTER SKILLS

MS Office Suites: Word, Excel, Outlook, and PowerPoint

LabView

WORK EXPERIENCE

October 2014 – November 2015

R&D NGP Electro Mechanical Technician

Medtronic Inc.

Executed released and approved reliability test protocols to predict the reliability of new and existing products at both system level and component level

Built, troubleshot, documented, and modified test fixture systems (Newport) with and without previous established drawings/schematics

Performed root cause failure analysis and troubleshooting (mechanical and electrical) for current and new products undergoing reliability characterization and/verification testing

Responsible for test equipment calibration and maintenance status as needed

March 2005 – June 2013

Test Technician

Teledyne Imaging Sensors Inc.

Worked on electrical phase probing Focal Plane Arrays (wafer and die level)

Used of SUSS PA-200 and PA-300 semi-automatic probers, supported test engineers, collect and analyze data results. Write procedures and work instructions

Responsible for building and implement test boxes guided by written procedures and layouts required by project engineer for functional phase tests

Tested FPA (Focal Plane Array) visible, midway and short wave detectors in environmental chambers (DEWARS) under vacuum and cooled by liquid helium and nitrogen acquiring temperatures in the range of 30 Kelvin to 77 Kelvin to simulate outer space environment, as well as vibration

Responsible setting, calibration and ordering of test equipment needed for each assignment

Troubleshot setup problems

Troubleshot component level

LabVIEW use for instrument control

November 1997 – January 2005

System Test Technician

Teradyne Inc.

Worked on bringing up VLSI 973, MEMORY (Marlin) Jaguar ATE Systems, from Semi-assembly to fully functional system integration, troubleshoot failures along the process

Generated test reports and got involved in TQC processes

Worked with Windows XP and Sun Station UNIX OS platforms

Green tagged boards for Field Service Applications

Performed field service position traveling to customer sites worldwide for repair and system maintenance

March 1991 – November 1997

Test Technician

Natel Inc.

Tested and troubleshot DC/DC converters, pacemakers in clean room environment using Eagle test equipment

Utilized electronic test equipment

Troubleshot from board to component level

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