EXPERIENCE AND TECHNICAL PROFICIENCIES
. Project management experiences on new process and equipment; Assist in
project origination; provide technical validation and conceptual design
of new projects
. Statistical control and process capability analysis
. Strong computer skills on software and system
. 7-years of semiconductor processing experience: MOCVD growth, fabrication
of nano-structures, GaN-based blue LED fabrication, including
photolithography, plasma etching, ion-beam milling, e-beam metal
evaporation, plasma enhanced chemical vapor deposition, rapid thermal
annealing
. Device testing: Electrical and Optical characteristics
. Characterization of semiconductor materials and device structures using:
Photoluminescence (PL), X-ray diffraction (XRD), Scanning electron
microscopy (SEM), Atomic force microscopy (AFM), Transmission electron
microscopy (TEM), Hall measurement
WORK EXPERIENCE
2008- 2/2014: Engineer, self-employed consultant, Lighting Solution LLC
. Consulting on commercializing GaN nanostructure devices.
. Providing consulting support to Fab design and operation.
. Directing manufacturing plans and supply chain management.
. Directing process engineering of LEDs in newly-built Fab oversea.
2007: Postdoc at Center for High Technology Materials, University of New
Mexico.
Responsibilities:
. Provide leadership for graduate students in research group
. Design MOCVD growth of III-Nitride semiconductor structures
. Design process for nanostructure fabrication
. Analyze growth results and test data
2000 - 2007: Research Assistant, at Center for High Technology Materials,
University of New Mexico.
Research Areas:
. Fabrication of Nano-structures (using Interferometic Lithography
and AAO)
. MOCVD growth of III-Nitride semiconductor structures using Veeco
reactor
. Material characterization and device processing & testing
EDUCATION
Ph. D. Degree: May 2007, Dissertation title "Growth, Characterization and
Device Application of GaN Nanowire Grown by MOCVD without Catalyst"
Electrical and Computer Engineering Department, University of New Mexico,
Albuquerque, NM
Master's Degree: May 2003, Electrical and Computer Engineering Department,
University of New Mexico, Albuquerque, NM
Master's Degree: December 1999, Electronics Engineering Department, Hebei
University of Technology, Tianjin, P. R. China
Bachelor's Degree: July 1994, Electronics Engineering Department, Hebei
University of Technology, Tianjin, P. R. China
CO-INVENTOR ON INVENTION DISCLOSURES
1. Patent No.: US 8,188,513 B2 "Nanowire and Larger GaN-Based HEMTs"
(Issued 2012)
2. Patent No.: US 7,521,274,B2 "Pulsed Growth of Catalyst-Free GaN
Nanowires and Application in Group III Nitride Semiconductor Bulk
Material" (Issued 2009)
3. UNM 730 "Catalyst-Free Growth of GaN Nanoscale Needles and Application
in InGaN/GaN Visible LEDs" (2005)
4. UNM 771 "GaN Pyramidal Array for Enhanced LED Performance" (2006)
PUBLICATIONS
1. "Unusually Strong Space-Charge-Limited Current in Thin Wires" A. Alec
Talin, Fran ois L onard, B. S. Swartzentruber, Xin Wang, and Stephen D.
Hersee, Phys. Rev. Lett. 101, 076802 (2008)
2. "Effect of threading defects on InGaN/GaN multiple quantum well light
emitting diodes" M. S. Ferdous, X. Wang, M. N. Fairchild and S. D.
Hersee, Applied Physics Letters 91, 231107 (2007).
3. "Fabrication of GaN Nanowire Arrays by Confined Epitaxy" Xin Wang,
Xinyu Sun, Mike Fairchild Steve Hersee, Applied Physics Letters 89,
233115 (2006).
4. "The Controlled Growth of GaN Nanowires", S. D. Hersee, X. Y. Sun, and
X. Wang, Nano Letters Vol. 6, No. 8, P1808-1811, (2006).
This research has just been highlighted in Nature Nanotechnology.
http://www.nature.com/nnano/reshigh/2006/0806/full/nnano.2006.35.html
5. "Photoelectrochemical Etching Measurement of Defect Density in GaN Grown
by Nanoheteroepitaxy" M. S. Ferdous, X. Y. Sun, X. Wang, M. N. Fairchild,
and S. D. Hersee, Journal of Applied Physics 99, 096105 (2006).
6. "Nanoheteroepitaxial Growth of GaN on Si (111) Nanopillars" S. D.
Hersee, X. Y. Sun, X. Wang, M. Fairchild, J. Liang, J. Xu, Journal of
Applied Physics, 97, 124308 (2005).
US status: US citizen