Joseph Kulik Curriculum vita

Joseph Kulik, PhD

Physicist, materials and condensed matter, materials characterization specialist

PO Box 424, Lemont, PA 16851 814-***-**** acduy0@r.postjobfree.com

SUMMARY

Condensed matter and materials physicist with over twenty years of work experience. Primary area

of expertise is in materials characterization. Successfully managed a multi-user TEM facility, have

had success in securing funding, and have co-managed research projects. Substantial teaching

experience, both laboratory and classroom.

I am a proven manager, research physicist, and instructor whose objective is to work in an

environment with people who share a commitment to doing quality science and engineering and to

communicating the excitement of science and technology to others.

AREAS OF EXPERTISE

• Over twenty years of experience in condensed matter and materials physics and nanotechnology

• Highly knowledgeable in materials characterization in general

• Specific areas of expertise include: transmission electron microscopy (TEM), scanning

transmission electron microscopy (STEM), and SEM. Expert in ancillary techniques such as

electron energy loss spectroscopy (EELS) and x-ray energy dispersive spectroscopy (XEDS),

electron scattering, electron diffraction, imaging theory, signal processing, electron optics

• Expert on applications of and operation of focused ion beam (FIB) instrumentation

• X-ray diffraction (XRD) experience

• Familiarity with nanofabrication techniques

• Familiarity with scanning probe microscopy (AFM), photoelectron spectroscopy (XPS), Auger

spectroscopy, Raman spectroscopy, and Fourier transform infra-red (FTIR) spectroscopy

• Eight years of management experience in a multi-user lab facility

• Experience in project management (thin film growth and characterization)

• Experienced instructor, including small groups and classroom teaching

• Computer programming experience (FORTRAN, C++)

EXPERIENCE

8/2004 – 6/2012 The Pennsylvania State University University Park, PA

Research Associate, Manager of the transmission electron microscopy (TEM) and focused ion

beam (FIB) laboratories at the Materials Research Institute

Successfully managed a lab with high-resolution TEM, scanning TEM (STEM), electron energy

loss spectrometer (EELS), energy filtered TEM (EFTEM), x-ray energy dispersive spectrometer

(XEDS), and focused ion beam instrument (FIB). By maintaining the equipment, establishing

standard operating procedures, and teaching and training users, I ensured that customers (equipment

users) obtained the data they needed to solve their scientific and engineering problems. Advised

investigators on how best to utilize electron microscopy or associated techniques to achieve the

goals of their projects. Collaborated with investigators, most significantly on projects involving

optimization of thin film growth for electronic and mechanical applications. Organized and taught

tutorials and short courses in order to further educate users and attract new users. Assisted faculty in

writing proposal for new equipment or equipment upgrades.

Spotlighted achievements:

Co-author on the following publications:

1. S.S.N. Bharadwaja, F. Griggio, J. Kulik, and S. Trolier-McKinstry, Highly textured laser annealed

Pb(Zr0.52Ti0.48)O3 thin films Appl. Phys. Lett. 99, 042903 (2011)

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Joseph Kulik Curriculum vita

2. E.H.T. Teo, J. Kulik, Y. Kauffmann, R. Kalish, and Y. Lifshitz, Nanostructured carbon films with

oriented graphitic planes, Appl. Phys. Lett. 98, 123104 (2011)

3. S.S.N. Bharadwaja, J. Kulik, R. Akarapu, H. Beratan, and S. Trolier-McKinstry, Ultrafast Crystallization

Kinetics in (Pb,La)(Zr0.30Ti0.70)O3 Thin Films by Pulsed Excimer Laser Annealing, IEEE Trans.

Ultrasonics, Ferroelectrics, and Frequency Control, 57, 2182 (2010) (Electron microscope image featured

on journal cover)

4. L.A. Donohue, A. Torosyan, P. May, D.E. Wolfe, J. Kulik and T.J. Eden, Investigation of PVD-DLC thin

films manufactured using HIPIMS etch / unbalanced magnetron sputter (UBM) deposition and secondary

mechano-chemical modification, Plating Surf. Fin., 96 (2009), p. 38

Helped to secure funding from National Science Foundation for purchase of an imaging filter for a

transmission electron microscope

Successfully organized and taught a graduate level class in transmission electron microscopy

12/200 – 7/2004 Motorola Semiconductor Products Sector (now Freescale Semiconductor)

Tempe, AZ

Product Analysis Engineer in the Arizona Product Development and Analysis Laboratory (4/2003

– 7/2004)

Provided support for the sensor-manufacturing facility with detailed analysis and assessment of

failure mechanisms. Worked principally on the micro-electro-mechanical systems (MEMS) that are

part of accelerometers. Also analyzed the electronic circuitry. Knowing how these sensors fail was

critical to maintaining quality control and minimizing failures in the future. The laboratory skills I

used in this position included confocal microscopy, laser scanning microscopy (LSM), scanning

electron microscopy (SEM), optical-beam induced resistance change (OBIRC), capacitance

measurements, and assessment of circuit IV characteristics.

Senior Scientist in the Process and Materials Characterization Laboratory (12/2000 – 4/2003)

Provided support for manufacturing and technology development by providing appropriate TEM,

STEM, EELS, and XEDS analysis. These analyses were often critical for maintaining product

quality. In technology development I provided essential feedback to film growers regarding thin

film quality. This feedback was at times highly valuable is assessing the practicality of new film

growth methods.

Spotlighted achievements:

Invited speaker at SEMATECH Analytical Lab Managers Council Meeting held at AMD, Sunnyvale, CA, 24 –

25 January 2002.

Recognized by upper management for critical contributions in the effort to assess the practicality of an oxide

buffer layer to integrate GaAs and Si.

9/1990 – 12/2000 University of Houston

Houston, TX

Research Assistant Professor, Department of Physics and Texas Center for Superconductivity:

Managed an analytical TEM laboratory with x-ray energy dispersive spectrometer (XEDS) and

electron-energy-loss spectrometer (EELS). In this capacity I contributed key structural and chemical

analyses to projects involving basic research into the properties of high-temperature

superconductors and various novel oxides with potential technological applications. Of note are the

contributions I made to ion damage studies in high-Tc superconductors (ion damage being important

as a possible source of magnetic flux pinning) and contributions to the study of ion-beam deposited

diamond-like carbon.

Spotlighted achievements

Co-Principal Investigator: Growth and characterization of boron nitride and carbon nitride thin films possible

materials for super-hard coatings.

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Joseph Kulik Curriculum vita

Key contributor to a project that elucidated the role of shallow implantation of ions in producing thin film stress in

ion-beam deposited, non-crystalline carbon films.

Key contributor to studies of spontaneous composition modulation in thin film semiconductor alloys as a possible

method of fabricating self-organized nano-wires for nanotechnology and nanomaterials applications.

AWARDS

• Motorola Arizona Technical Award in recognition of significant achievement in providing

creativity and technical excellence in the study of the atomic and electronic structure of the

Si/hafnia interface.

• Motorola Technical Award for significant contributions to the study of strontium titanate thin

films on Si.

EDUCATION

Doctorate University of California, Berkeley Physics

Bachelor Massachusetts Institute of Technology Physics

SELECTED TEACHING EXPERIENCE

Pennsylvania State University, Department of Materials Science and Engineering.

Graduate course in transmission electron microscopy including laboratory sessions. (2011)

University of Houston, Department of Mechanical and Materials Engineering.

Graduate course in transmission electron microscopy (1997)

SYNERGISTIC ACTIVITIES

Volunteer instructor for Osher Lifelong Learning Institute

Reviewer for Physical Review B, Physical Review Letters, and Journal of Applied Physics

Reviewer for National Science Foundation (NSF), Participant on NSF electron-microscopy-related

instrumentation panel (Instrumentation for Materials Research and Major Research Instrumentation, 2003).

GRANTS FUNDED

Fermi surface determination of quasicrystals via Compton scattering. (Co-PI with Drs. S.C. Moss and P.

Chow) Agency: NSF (International Cooperative Activities Grant), Award: $31,275 Duration: 2 yrs

(2/2000 – 1/2002)

Carbon nitride and carbon nitride/titanium nitride multilayer synthesis for hard coating applications.

(Co-PI with Dr. A. Bousetta) Agency: Texas Higher Education Coordinating Board, Award: $ 175,000;

Duration: 2 yrs. (1/96 - 12/97)

PROFESSIONAL MEMBERSHIPS

American Physical Society, Microscopy Society of America, Materials Research Society

INVITED TALKS

Characterization of HfO2 films for high-k gate application. Presented at 2003 Mechanics and Materials

Conference, 17 - 20 June 2003, Scottsdale, AZ.

TEM of Medium-k and High-k Materials at Motorola. Presented at SEMATECH Analytical Lab Managers

Council Meeting at AMD, Sunnyvale, CA, 24 – 25 January 2002.

Effect of ion energy and growth temperature on the structure of ion-beam deposited carbon films. Presented

at the 3rd Specialist Meeting on Amorphous Carbon, 30 Aug – 1 Sept 2000, Mondovi (Italy).

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Joseph Kulik Curriculum vita

X-ray and TEM studies of short-range order in Al 1-xInxAs thin films. Presented at MRS Fall 1999

Symposium entitled “Self-Organized Processes in Semiconductor Alloys – Spontaneous Ordering,

Composition Modulation, and 3-D Islanding”.

Cu3Pd Observed by High-Voltage Electron Microscopy. Presented at the Workshop on Competing

Interactions and Microstructures: Statics and Dynamics, Los Alamos, NM, May 5-8, 1987

Research in the TEM Lab at the Superconductivity Center. Presented at Department of Physics Colloquium,

Sam Houston State University, Huntsville, Texas, Fall 1993

SELECTED PUBLICATIONS

1. S.S.N. Bharadwaja, F. Griggio, J. Kulik, and S. Trolier-McKinstry, Highly textured laser annealed

Pb(Zr0.52Ti0.48)O3 thin films Appl. Phys. Lett. 99, 042903 (2011)

2. Huang H, Fox JT, Cannon FS, Komarneni S, Kulik J, Furness J., Binding waste anthracite fines with Si-containing

materials as an alternative fuel for foundry cupola furnaces, Environ Sci Technol., 45(7):3062-8 (2011).

3. E.H.T. Teo, J. Kulik, Y. Kauffmann, R. Kalish, and Y. Lifshitz, Nanostructured carbon films with oriented graphitic

planes, Appl. Phys. Lett. 98, 123104 (2011)

4. S.S.N. Bharadwaja, J. Kulik, R. Akarapu, H. Beratan, and S. Trolier-McKinstry, Ultrafast Crystallization Kinetics in

(Pb,La)(Zr0.30Ti0.70)O3 Thin Films by Pulsed Excimer Laser Annealing, IEEE Trans. Ultrasonics, Ferroelectrics, and

Frequency Control, 57, 2182 (2010) (STEM image featured on journal cover)

5. L.A. Donohue, A. Torosyan, P. May, D.E. Wolfe, J. Kulik and T.J. Eden, Investigation of PVD-DLC thin films

manufactured using HIPIMS etch / unbalanced magnetron sputter (UBM) deposition and secondary mechano-

chemical modification, Plating Surf. Fin., 96 (2009), p. 38

6. X. Zhang, J. Kulik, E.C. Dickey, Diffusion in SiXGe1-x/ Si Nanowire Heterostructures, Journal of Nanoscience and

Nanotechnology, 7 (2), 717–720 (2007).

7. S. Myhajlenko, A. Bell, F. Ponce, J. L. Edwards, Y. Wei, B. Craigo, D. Convey, H. Li, R. Liu, and J. Kulik, J. Appl.

Phys. 97, (2005).

8. R.Krishnan, M.Molinari, Q.Xie, J.Kulik, X.D.Wang, S.Lu, Y.Gao, T.D.Krauss, and P.M.Fauchet, Charge localization

and transport in a single layer of silicon nanocrystals, J. Appl. Phys. 96, 654 (2004).

9. Y. Liang, J. Kulik, Y. Wei, T. Eschrich, J. Curless, B. Craigo, and S. Smith, Hetero-Epitaxy of Crystalline Perovskite

Oxides on GaAs(001), Mat. Res. Soc. Symp. Proc. Vol. 786, E8.4.1 (2004)

10. D. Triyoso, R. Liu, D. Roan, M. Ramon, N. V. Edwards, R. Gregory, D. Werho, J. Kulik, G. Tama, E. Irwin, X-D.

Wang, L. B. La, C. Hobbs, R. Garcia, J. Baker, B. E. White Jr., and P. Tobin, Impact of Deposition and Annealing

Temperatures on Material and Electrical Characteristics of ALD HfO2, J. Electrochem. Soc. 151, F220 (2004).

11. J. Kulik, Transmission Electron Microscopy for Analysis of sp3-Bonded Carbon and Boron Nitride, New Diamond

and Frontier Carbon Technology 14, 59 (2003).

12. X. Zhang, A.A. Demkov, Hao Li, X. Hu, Yi Wei, J. Kulik, The atomic and electronic structure of the Si /SrTiO3

interface, Phys. Rev. B 68, 125323-1 (2003).

13. H. Li, X. Hu, Y. Wei, Z. Yu, X. Zhang, R. Droopad, A.A. Demkov, J. Edwards, K. Moore, W. Ooms, J. Kulik, and P.

Fejes, Two-dimensional growth of high-quality strontium titanate thin films on Si, J. Appl. Phys. 93, 4521 (2003).

14. J. Schaeffer, N. V. Edwards, R. Liu, D. Roan, B. Hradsky, R. Gregory, J. Kulik, E. Duda, L. Contreras, J.

Christiansen, S. Zollner, P. Tobin, B.-Y. Nguyen, R. Nieh, M. Ramon, R. Rao, R. Hegde, R. Rai, J. Baker, and S.

Voight, HfO2 Gate Dielectrics Deposited via Tetrakis Diethylamido Hafnium, J. Electrochem. Soc. 150, F67 (2003).

15. Xiaoming Hu, H. Li, Y. Liang, Y. Wei, Z. Yu, D. Marshall, J. Edwards, Jr., R. Droopad, X. Zhang, A. A. Demkov, K.

Moore, and J. Kulik, The interface of epitaxial SrTiO3 on silicon: in situ and ex situ studies, Appl. Phys. Lett. 82, 203

(2003).

16. L. Hilt Tisinger, R. Liu, J. Kulik, X. Zhang, J. Ramdani, and A. A. Demkov, Ultraviolet-Raman studies of SrTiO3

ultrathin films on Si, J. Vac. Sci. Tech. B 21, 53 (2003).

17. Z. Zhong, V. Holý, J. H. Li, J. Kulik, J. Bai, T. D. Golding, and S. C. Moss, X-ray study of antiphase boundaries in

the quadruple-period ordered GaAs0.87Sb0.13 alloy, J. Appl. Phys. 90, 644 (2001).

18. J. H. Li, J. Kulik, V. Holý, Z. Zhong, S. C. Moss, Y. Zhang, S. P. Ahrenkiel, A. Mascarenhas, and Jianming Bai, X-ray

diffraction from CuPt-ordered III-V ternary semiconductor alloy films, Phys. Rev. B 63, 155310 (2001).

19. Z. Zhong, J. H. Li, J. Kulik, P. C. Chow, A. G. Norman, A. Mascarenhas, J. Bai, T. D. Golding, and S. C. Moss,

Quadruple-period ordering along [110] in a GaAs0.87Sb0.13 alloy, Phys. Rev. B 63, 033314 (2001).

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Joseph Kulik Curriculum vita

20. J. H. Li, V. Holý, Z. Zhong, J. Kulik, S. C. Moss, A. G. Norman and A. Mascarenhas, J. L. Reno and D. M. Follstaedt,

X-ray analysis of spontaneous lateral modulation in (InAs)n/(AlAs)m short-period superlattices, Appl. Phys. Lett. 78,

219 (2001).

21. H. Y. Peng, N. Wang, Y. F. Zheng, Y. Lifshitz, J. Kulik, R. Q. Zhang, C. S. Lee, and S. T. Lee, Smallest diameter

carbon nanotubes, Appl. Phys. Lett. 77, 2831 (2000).

22. J. Kulik, R.L. Forrest, J. Li, T. Golding, S.C. Moss, and J. Bai, X-ray and TEM studies of short-range order in Al1-

InxAs thin films, in “Self-Organized Processes in Semiconductor Alloys – Spontaneous Ordering, Composition

x

Modulation, and 3-D Islanding”, MRS Symposium Proceedings Vol. 583 (Materials Research Society, Pittsburgh,

PA, 2000) pg. 179.

23. J. Kulik, G. Lempert, E. Grossman, and Y. Lifshitz, Oriented graphitic carbon film grown by mass-selected ion beam

deposition at elevated temperatures, in “Amorphous and Nanostructured Carbon”, MRS Symposium Proceedings

Vol. 593 (Materials Research Society, Pittsburgh, PA, 2000) pg. 305.

24. R. Forrest, J. Kulik, T. Golding, and S.C. Moss, X-ray Diffraction and TEM Analysis of Ordering and Structure in

Al1-xInxAs Thin Films, Journal of Materials Research 15, 45 (2000).

25. A. Tempez, N. Badi, J. Kulik, and A. Bensaoula, Surface composition of BN, CN, and BCN thin films, J. Vac. Sci.

Tech. A 16, 2896 (1998).

26. S. Prawer, K.W. Nugent, Y. Lifshitz, G.D. Lempert, E. Grossman, J. Kulik, I. Avigal, and R. Kalish, Systematic

variation of the Raman spectra of DLC films as a function of sp2:sp3 composition, Diamond Relat. Mater. 5, 433

(1996).

27. J.W. Rabalais, A.H. Al-Bayati, K.J. Boyd, D. Marton, J. Kulik, Z. Zhang, and W.K. Chu, Ion-energy effects in silicon

ion-beam epitaxy, Phys. Rev. B 53, 10781 (1996).

28. E. Grossman, G.D. Lempert, J. Kulik, D. Marton, J.W. Rabalais, and Y. Lifshitz, Role of ion energy in determination

of the sp3 fraction of ion beam deposited carbon films, Appl. Phys. Lett. 68, 1214 (1996).

29. J. Kulik, G.D. Lempert, E. Grossman, D. Marton, J.W. Rabalais, and Y. Lifshitz, The sp3 content of mass-selected ion-

beam deposited carbon films determined by inelastic and elastic electron scattering, Phys. Rev. B 52, 15812 (1995).

30. A.H. Al-Bayati, S.S. Todorov, K.J. Boyd, D. Marton, J. Kulik, and J.W. Rabalais, Homoepitaxy and controlled

oxidation of silicon at low temperatures using low-energy ion beams, J. Vac. Sci. Tech. B 13, 1639 (1995).

31. K.J. Boyd, D. Marton, S.S. Todorov, A.H. Al-Bayati, J. Kulik, R.A. Zuhr, and J.W. Rabalais, Formation of C-N thin

films by ion beam deposition, J. Vac. Sci. Tech. A 13, 2110 (1995).

32. Y. Lifshitz, G.D. Lempert, E. Grossman, I. Avigal, C. Uzan-Saguy, R. Kalish, J. Kulik, D. Marton, J.W. Rabalais,

Growth mechanisms of DLC films from C+ ions: experimental studies, Diamond Relat. Mater. 4, 318 (1995).

33. J. Kulik, Y. Lifshitz, G.D. Lempert, J.W. Rabalais, and D. Marton, Electron energy loss spectroscopy of mass-selected

ion-beam deposited diamondlike carbon, J. Appl. Phys. 76, 5063 (1994).

34. Y. Lifshitz, G.D. Lempert, S. Rotter, I. Avigal, C. Uzan-Saguy, R. Kalish, J. Kulik, D. Marton, and J.W. Rabalais, The

effect of ion energy on the diamond-like/graphitic (sp3/sp2) nature of carbon films deposited by ion beams, Diamond

Relat. Mater. 3, 542 (1994).

35. Z.J. Huang, R.L. Meng, X.D. Qiu, Y.Y. Sun, J. Kulik, Y.Y. Xue, and C.W. Chu, Superconductivity, Structure, and

Resistivity in HgBa2Ca2Cu3O8+δ, Physica C 217, 1 (1993).

36. R.L. Meng, Y.Y. Sun, J. Kulik, F. Chen, Y.Y. Xue, and C.W. Chu, Superconductivity at 112-117 K in

HgBa2CaCu2O6+δ, Physica C 214, 307 (1993).

37. J.R. Liu, J. Kulik, Y.J. Zhao, and W.K. Chu, Radiation damage and flux pinning in high temperature superconductors,

Nucl. Inst. Meth. Phys. Res. B 80/81, 1255 (1993).

38. X.B. Kan, J.L. Robertson, S.C. Moss, J. Kulik, T. Ishimasa, M. Mori, A. Quivy, D. Gratias, V. Elser, and P. Zschack,

Crystallographic characterization of a single quasicrystal of Al-Cu-Fe, J. Non-Cryst. Solids 153 & 154, 33 (1993).

39. Y.J. Zhao, W.K. Chu, J.R. Liu, J. Kulik, H. Zandbergen, and Y.K. Tao, High-resolution transmission electron

microscopy study of the radiation damage defects in high temperature superconductors, Appl. Phys. Lett. 61, 19

(1992).

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