DAVID LE
Norwood, MA *****
Home Phone: 781-***-****
Cell Phone: 617-***-****
EMAIL ADDRESS: ***********@*******.***
EXPERIENCE:
RAYTHEON COMPANY ANDOVER, MA
Sr. Test Engineer 1 – Hired in August 2016, worked in June 2017 to present
Interpret test requirements and documenting procedures.
Perform final Missile test data analysis and performance scoring.
Initiate and/or coordinate Engineering Change Requests and Change Notices to improve factory flow and product quality.
Collect, analyze and present test failure data – driving to root cause and corrective action.
Ensure hardware requirements are met and processes are followed
Assist manufacturing operators in the test & troubleshoot of production hardware.
Support test and troubleshooting of RF, Microwave, Digital hardware and Data Analysis on Patriot Missile performance.
Provide technical supports to internal customers for system and sub-system testing and work with design engineers on technical issues relating to the test process.
Develop test procedures and generate Engineering Change Requests (CRs) on technical issues.
Diagnose and resolve hardware/software problems at Debug/Test Stations for Test Operators/Technicians.
EMC CORPORATION FRANNKLIN, MA
FA Lab Test Engineer/Hardware Engineer 2 – June 2007 to May 2016
Debug and troubleshoot various Digital and Analog Circuit Boards including Service Processors, IO cards, Link Control cards, etc.
Modify and use computer software (Labview, ATeasy, C, C++) and hardware to conduct tests on electronic products and systems or software. Also use test equipment, logic analyzers, digital signal analyzers, etc. to help find the root cause.
Utilize and modify test software to test and debug various circuits.
Analyze and interpret test data and prepare technical reports for use by electronic or software engineering, and management personnel. Provide resolution of problems to managers for new failure trend.
Contribute to the fulfillment of projects and organizational objectives. Direct and coordinate electronic engineering activities concerned with development, procurement, installation and calibration of instruments, equipment and control devices required to test and record test data.
Communicate with customers/vendors on fault analysis, failure trends and routine matters.
Provide guidance, training, instruction to non-exempt personnel on test hardware and software, as well as proper problem solving techniques. Direct and coordinate electronic engineering and technical personnel in fabrication and design of testing and test control apparatus and equipment, or software and systems testing.
Research, evaluate, and develop new processes and methods to detect manufacturing defects.
Responsible to provide a core competency to engineering and manufacturing in the area of Automatic Test Defect Detection. Determine conditions under which tests are to be conducted and sequences and phases of test operations. Interface and confer with scientific, engineering and technical personnel to resolve testing problems such as product or system malfunctions, incomplete test data, data interpretation or coding issues.
Resolve test yield problems by performing analysis of root causes, developing and coordinating corrective action measures and monitoring improvements.
Develop test plans and procedures.
Coordinate 3rd party development of functional test development and enhancements.
ANALOGIC CORPORATION PEABODY, MA
Test Engineer – June 2006 to June 2007.
Troubleshoot PCBs (Analog and Digital) to component level.
Troubleshoot system (MRI/CT Ultrasound Data Acquisition System Unit) hardware and software down to board level to determine root cause and implement corrective action.
Develop test project plans and interfacing with various engineering and operational groups, as well as vendors, to achieve desired cycle-time improvement goals and to reduce the number of defective returned products.
Set up for the test station, providing training and technical support for Test Technicians and customers.
TERADYNE INC. NORTH READING, MA
Test Engineer – 1998 to December 2005.
Test and troubleshoot complex Surface Mount Integrated products.
Work with suppliers and customers to drive process improvements through means of all available TQM tools.
Work with other members in the Digital Process Group, Analog Process Group, design engineering (hardware, software) group, test technology group, and component engineering group to determine root cause and corrective action for complex design and test issues.
Troubleshoot PCBs (Analog and Digital, Mainframe and Channel Card) to component level.
Troubleshoot systems (Catalyst, A5XX), hardware and software down to board level to determine root cause and implement corrective action.
Develop test project plans and interfacing with various engineering and operational groups, as well as vendors, to achieve desired cycle-time improvement goals and to reduce the number of defective returned products.
TERADYNE INC. NORTH READING, MA
Test Technician – 1997 to 1998
Troubleshoot various Analog and Digital boards down to component level using A5XX, Catalyst, L200, L621, L135 and external equipment including oscilloscopes, spectrum analyzers, function generators and digital multimeters to identify failures to fix problems with minimal technical support.
Maintain Component Test System (Catalyst and A5XX systems).
Troubleshoot systems (hardware and software) down to board level.
ENERGY SCIENCES INC. WILMINGTON, MA
Field Service Engineer – 1996 to 1997
Assist Design Engineer to upgrade PCB’s.
Perform R&D tests, debugging and analyzing problems.
Troubleshoot Digital and Analog Circuits, setting up test procedures for other technicians.
Perform final tests for High Voltage Power Supply Unit and Microprocessor Control Unit for Electron Beam Systems.
Perform technical support services for customers through visits, demonstrations, training courses and telephone contact.
Perform business and technical activities in meetings and conferences.
Provide test reports to managers and customers.
EDUCATION:
WENTWORTH INSTITUTE OF TECHNOLOGY, BOSTON, MA
Bachelor of Science in Computer Engineering Technology, September 1996.
References available upon request.