Engineer Chemical Engineering
Resume:
Brian D. Shea
Charlestown, MA 02129
Email (*****.******@*****.***)
SUMMARY:
Chemical Engineer/Geologist with a diverse background in research (III-V Nitrides Thin/thick-electro-material-films and formulations for MOCVD and CVRP), transport, surface chemistry, cleanroom, quality control, and the material/environmental geological industry utilizing instrumentation, characterization: (TEM, SEM, FTIR), petrographic light microscopy for particle crystallographic and rheological analysis. MS suite including MATLAB/SIMULINK for calculations and simulations for fluid dynamics. Electro-chemical formulations for self-assembly-molecules creating a double layer for dendrimer transport for solgel and metallurgic-nano-powder processes.
Utilized:
Experimentation/instrumentation for electro-thin/thick-metal-films and nano, powder coatings utilizing metallurgical grade silica and other conductive blend experience
ISO 90001/14001, SOP, GLP, six sigma, SAP, proficiency testing, Audit
Upgrades, P&ID, PFD, EH&S,, PHA and clean room; 100, 1000, AS9300, 7, 8
Quality Control Cord; charted data via Excel: SPC RCA, PCA (Monte Carlo model)
Instrumentation: TEM, SEM, XRD, NMR, FTIR, HPLC and AA for heavy metals
EDUCATION:
University of Massachusetts – Lowell, MA
Department of Chemical Engineering – M.S.E Chemical Engineering
Thesis: Characterization and process of GaN on a (0001) Sapphire substrate
Salem State College – B.S. Geology major concentration: Geochemistry
PROFESSIONAL EXPERIENCE:
American Redcross May 2016 - Present
Teach CPR, health and safety and first aid
September 2015 to November 2015
General Electric:
Westbourogh MA ISO Temporary postion. AS9300 utilizing clean room 7, 8, for disposable bioreactors and packaging.
Koch Membrane Systems May 2015 – July 2015
Wilmington, MA Temporary chemical operations position in a pilot test lab including quality testing, P&ID, PFD and floor work ISO 9001 SOP. Mixing pwder formulations for glycerine coating on hollow nylon tubes. Trouble-shooting process to enable proper production capabilities.
George Mason University (Teranomics)
Manassas, VA April 2006 – September 2011
Analyst/Chemical Engineer: Characterization by XRD, TEM/Cross sectional analysis for corrosion and deformation, SEM, FT-IR, DSCand TGA. Compiled and presented data for nano powder development double layer schemes including mixing and conveying. Utilized SAP and wrote proposals as well as formatting MSDS, and managed other projects such as QC and EH&S .
AMERI SCI
Boston, MA December 2004 – August 2005
Analyst/Engineer – Contract work: quality control using MS Excel, materials testing, mineral characterization; PLM, TEM utilizing SAED and EDAX, ISO 14001/9001 AHERA, SOP, GLP, separation processes using filtration for sludge and water samples.
Quincy College
Quincy, MA September 2002 – June 2004
Adjunct Faculty Instructor – Taught eleven college courses in math, algebra, physics, General Chemistry II with organic supplements and laboratory.
Department of Chemical & Nuclear Engineering Center for Advanced Materials
UMass Lowell January 2000 – June 2005
Research Assistant/Associate Engineer # 3–Thin/thick-ceramic-metal-film and corrosion analysis with reactor design upgrade (CVRP) for sublimation processes. Utilized VLSI technology with TEM, SEM, AFM, XRD, DSC and TGA for both internal and surface studies and characterization. Other ceramic substrates used include SIC, ITO and ZnO. Sputtering thin-films on substrates and wet and dry etching. Doping with phosphine, arsine, borane, Software consisted of MS Excel, Aspen and MATLAB/SIMULINK for desktop calculations and simulations (Monte Carlo model). Developed polymer boudinless PET fibers with solvents and extrusion apparatus design. Utilizing self-ensemble-of-molecules creating dendrimers (emulsions) formulations on a double layer powder processing schemes. Initiated client lab demonstrations for potential new projects and trained new staff on instrumentation and GLP protocols, such as QC and EH&S utilizing ISO9001/14001.
Sensory Directorate
Hanscom Air Force Base
Lincoln MA January 2000 – February 2003
Research and Development - Thin/Thick-film formulations and analysis; fabrication for processing of a GaN semiconductor on a sapphire substrate using a template grown by Metal Organic Vapor Deposition (MOCVD). Developed Al-GaN/In-Al-GaN bridges by high temperature ramping with ammonia injection (creating holes) for nitridation of Gallium metal with better adherence of a GaN thick-film thereby reducing aggregation on the epilayer deposited by the chemical vapor reaction process reactor (CVRP).Utilized TEM, SEM, AFM and x-ray diffraction to conduct surface analysis. Doping with phosphine, arsine, and borane
PROSCIENCE Woburn, MA March 1999 – August 2000
TEM Analyst – Contract work: TEM analysis of minerals, Industrial materials, sludge, water separation filtrations, GLP, quality control ISO 9001/14001 and SOPs.
SAFETY KLEEN Andover, MA May 1998 – February 1999
Remediation – Clean-up of toxic and hazardous wastes and spills. Followed procedures and protocols for SARA, CERCLA, OSHA, DOT, EH&S, and EPA.
HYGIENETICS ENVIRONMENTAL Inc.
Boston, MA October 1988 - November 1998
Staff Scientist II – Responsible for the overall management, operation and maintenance of the Transmission Electron Microscope (TEM) Laboratory including processing, quality control (AHERA, EPA, ISO 9001/14001), and equipment maintenance.
Quality Control Coordinator – Maintained quality control for sample analysis. Compiled statistical database using MS Excel; chartered data, SOPs and GLP. Wrote monthly progress notes maintained MSDS files, performed proficiency testing and preparation.
CONFERENCES:
American Association of Crystal Growth, Burlington, VT 8/15/01
Author and Presenter: TEM Characterization of Thick-film GaN Epitaxy on (0001) Sapphire Substrates by Halide Transport Process.
Microscope & Microscopist, (M&M) San Francisco, CA 7/14/01
Author: TEM characterization of Thick-film GaN Epitaxy on (0001) Sapphire Substrates by CVRP.
American Ceramic Society, Indianapolis, IN, 4/24/01
Co-Author: TEM Characterization of a GaN Thin-film Buffer Layer on (0001) Surface Sapphire Substrates by MOCVD.
PROFESSIONAL MEMBERSHIPS:
Materials Research Society (MRS)
American Chemical Society (ACS)
New England Society for Microscopy (NESM)
CERTIFICATION:
OSHA HAZWOPER and NIOSH, Material Science
EDUCATION:
University of Massachusetts – Lowell, MA
Department of Chemical Engineering – M.S.E. Chemical Engineer
Thesis: Characterization and process of GaN on a (0001) Sapphire substrate
Salem State College – Salem MA Department of Earth Science – B.S. Geology Field Camp: ME, VT, NY, MA, FL, and Nova Scotia; Thesis; igneous, structual mapping and sedimentary geology
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