Information Systems, Quality, Analyst
Resume:
Ted E Neil
Round Rock, Texas 78664
*******@*********.***
Objective
To utilize my quality training and experience, especially in creating and maintaining a quality system.
Experience
2004 - 2017 Cerium Labs, LLC, Austin, TX
Quality Manager - Implement and maintain ISO/IEC 17025 Accreditation
1999 - 2017 AMD/Spansion/Cerium Labs, LLC, Austin, TX
Senior Materials Engineer
Operate a Cameca ims-6f SIMS, and a Atomika 4500 Quadrupole SIMS
Operate and maintain a Bede D3 X-ray Diffractometer
Operate and maintain a Digital Instruments D-5000 Atomic Force Microscope
Perform materials science surface analysis to solve semiconductor problems
2009 – present Math, Music, & More
Instructor – one day a week
Teach High School Physics, Chemistry & Biology to Home Schooled Students
2012-2014 University of Mary Hardin-Baylor
Adjunct Professor - Teach Business Information System classes
1994 - 1999 Motorola, Austin, TX
Senior Scientist
Perform materials science surface analysis to solve semiconductor problems
1993-1994 Sematech, Austin, TX
Analytical Specialist
Perform materials science surface analysis to solve semiconductor problems
1990-1993 Sandia National Laboratories, Albuquerque, NM
Senior Technical Associate
Operate and maintain various analytical equipment
1985-1990 Sonodyne America Ltd, Morrisville, NC
Project Engineer
Analyze Thermistor production and research and development data
1979-1985 Abilene Christian University, Abilene, TX
Student, Lab Instructor, Research Assistant
Ted Neil – page 2
Education
Master of Science in Information Systems – Management track
University of Mary Hardin-Baylor
Belton, Texas
Graduation: August 2012
Current GPA: 4.0 (4.0 scale)
Bachelor of Science Degree: Physics, Mathematics
Minor hours: Chemistry, Computer Science, Bible
Abilene Christian University
Abilene, Texas 79699
Graduation: May 1985
GPA: 3.21 (4.0 scale)
Publications
“Fluence Loss Due to Rutherford Backscattering for Very Low Energy Ion Implantation in Silicon,” Nuclear Instruments and Methods in Physics Research B, 219-220 (2004), pp. 804-809, (with Zhiyong Zhao, Che-Hoo Ng, Jinning Liu, and Jianyue Jin).
"Depth Profiling of Ultra-shallow B Implants Using a Cameca IMS-6f," Proceedings of the Eleventh International Conference on Secondary Ion Mass Spectrometry, Wiley, 1998, (with L. Wu, D. Sieloff, J. Lee, D. Dyer, and S. Collins).
"SIMS Characterization of Interfacial Nitrogen for Oxynitride Dielectric Thin Films," Proceedings of the Eleventh International Conference on Secondary Ion Mass Spectrometry, Wiley, 1998, (with L. Wu, D. Sieloff, J. Lee, and R. Hegde).
"The Dependence of Ultrashallow Junction Depths on Impact Dose Rates," Applied Physics Letters, Vol 67, 28 Aug. 1995, p. 1223-1225, (with A. Sultan, M. Craig, K. Reddy, S. Banerjee, E. Ishida, P. Malliot,
and L. Larson).
"Copper Enrichment on Al2O2 Surface After De-Oxidizing Treatment," 51st Proceedings, Microscopy Society of America, 1993, p. 860, (with C.A. Drewien, R.G. Buchheit, and D.R. Zavadil).
"Mechanical Equivalent of Heat by Boiling Liquid Nitrogen," American Journal of Physics, Vol 54, May 1986, p. 474, (with P.D. Schulze).
"Adsorption of Water and Oxygen on FeTiO3 Studied by XPS," Journal of Vacuum Science and Technology A, Vol 3, Jan. 1985, p. 6, (with P.D. Schulze, S.L. Shafer, R.W. Smith, and D.S. McKay).
References - Available on request
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