Electrical Engineer (Test)

Roger Carter

(Home) 321-***-**** (Cell) 321-***-****

************@*****.*** linkedin.com/in/rogerccarter

"Diligence in work is one's indelible signature."

SUMMARY

Skilled ATE IC Test Engineer with extensive experience in the testing of

switching regulators for Consumer Electronics and multi-channel integrated

LCD supply IC's for Power Management applications. From the hardware design

stage, requiring effective written and verbal communication within the

development group for accurate interface of ATE resources and chip logic,

to the software generation step, where analytical thinking and reasoning

skills help merge full parametric testing with test time efficient code,

multi-site mixed signal and digital test solutions are created, debugged,

and correlated through attention to detail and thorough data analysis

techniques. Being self motivated with a strong work ethic and openness to

recommendations and guidance from peers, my goal is the successful release

of solutions that meet device specifications and bring a greater return on

investment for my employer.

TECHNICAL SKILLS

. Operating Systems: UNIX, Windows 2000.

. Software / Languages: Microsoft Visual C++, Windows 2007, Microsoft

Office Suite, Cadence Concept Allegro, Adobe Frame Maker, Test

Insight, Compare and Merge.

. ATE platforms: Eagle ETS-300, ETS-364, and ETS-364 G2, Teradyne A360,

A565, A575, and A580/A585, and Fairchild Sentry test systems.

. Lab equipment: Oscilloscopes (Tektronix, LeCroy), signal generators,

power supplies (standard, programmable), multi-meters, soldering

equipment (SMD and through hole).

EXPERIENCE

Intersil Corporation - Palm Bay, FL.

Staff Test Engineer 1996 - 2013

Job Scope

Provide test support for new product introductions and offshore

manufacturing.

. Created hardware schematics for ATE testing of 20+ devices, ensuring

compliance with design specifications and data sheet parameters.

. Analyzed ATE test time profiles of all test functions for optimization

of multi-site test times and the accompanying reduction of test

related costs, and increased unit throughput.

. Reconciled parameter measurement discrepancies between lab and ATE

data, guaranteeing device data sheet compliance and successful

completion of device characterization to design specifications.

. Experienced in the debug and correlation of multi-site hardware boards

for ATE production testing, thereby ensuring reliability and

uniformity of tests across multiple test boards.

. Performed root cause analysis of device pin damage on 10+ products

utilizing Transient Analysis methods to improve and ensure product

quality and reliability.

. Implemented methods for the prevention of re-trim of package parts and

for the elimination of un-trimmed package test devices from the final

EQA step.

. Strengthened multi-site ATE program repeatability and reliability

through the use of FMEA.

. Resolved all offshore production test related issues (Frequency

measurement instability, minimum pulse width measurement, EPROM

writing and read-back issues, test mode related issues, etc) on 10+

products with assigned responsibility as part of continuous

improvement process.

. Initiated efforts with Multitest IC test socket designers for creation

of a common footprint for their Nano-Kelvin and non-Kelvin Econ IC

test sockets.

. Implemented the first Kelvin socket solution in volume production

testing of switching regulators for precision Rdson measurements.

. Successfully converted a quad-site solution for a family of Power

Distribution Controllers across tester platforms with an accompanying

increase in test parameter coverage and a 75% reduction in overall

test time.

. Resolved test yield issues related to handler testing via a re-design

of the handler-tester interface docking.

Lead Test Engineer 1988 - 1996

Job Scope

Provide test support for new product introductions and offshore

manufacturing.

. Collaborated with cable manufacturer to design a 10 pin coax cable for

use with PIE board applications on SRM handlers for the production

testing of AC data sheet parameters of 3x3 DFN switching regulators.

. Designed a generic ETS-364 Eagle Tester load board for use with PIE

board applications on SRM handlers.

. Created the first Test Requirements Document from Frame Maker

detailing the test methods and measurement techniques of all Data

Sheet parameters for a switching regulator.

. Successfully completed the installation and correlation of 3 different

ATE test systems at offshore Asian manufacturing facilities using

multi-site test programs, thereby resulting in greater factory

capacity coupled with lower per unit test cost.

. Coordinated all hardware and software transfers of responsible

products to production operations at remote Asian sub-cons, ensuring

smooth production ramp-up.

ADDITIONAL EXPERIENCE

Senior Test Engineer 1985 - 1988

Job Scope

Provide software and hardware production support and resolution of

customer return issues.

. Generated digital fault simulation vectors for a Microprocessor

peripheral, resulting in greater than 98% fault coverage for

production test.

. Knowledgeable in the use of tester based DSP algorithms for testing

SLIC products.

Test Engineer 1983 - 1985

Job Scope

Provide manufacturing test support for mature products in production.

. Analyzed customer data on returned field rejects for implementation of

test screens to enhance outgoing device quality.

Solitron Devices - Riviera Beach, FL.

Test Engineer

. Conducted bench testing, evaluation, and repair of power hybrid

circuit modules for military applications.

. Coordinated the efforts for the repair of these modules at the

individual component level and generated a step by step procedure for

production personnel to use in the on-going debug and repair process.

ITT Microsystems - Deerfield Beach, FL.

Test Engineer

. Conducted evaluations of switched capacitor filter designs for use in

communication circuits using SPICE and FILSYN and co-authored one such

paper published in an IEEE journal.

. Compiled lab data from the bench testing and temperature evaluation of

pace makers for Medical applications.

. Evaluated performance parameters of DTMF (Dual Tone Multi-Frequency)

circuits for the telephone industry through extensive bench top

testing.

EDUCATION

BSEE, Electrical Engineer, Florida Atlantic University, Boca Raton, FL.

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