VAN T NGUYEN
** **** **. ********, ** *****
781-***-**** (H), 781-***-**** (C).
Email: ********@*****.*** (H)
OBJECTIVE: To seek a TEST ENGINEER position to utilize my extensive Testing,
Troubleshooting, Supporting, In Circuit Testers and Functional Programming
experiences in a challenging and creative environment.
EXPERIENCE:
Jan/2011-Dec/2012: Sr. Manufacturing Engineer at Brooks Automation. Chelmsford, MA
Supported Electronics Work Cell, Cable & Chassis, and In Coming Test Stands
departments; Helped Technicians in troubleshooting PCBs, Modules and
Systems failures; Created ECOs for Manufacturing Quality Plan; Corrected Build
&Test Work Instructions; Worked with venders to perform root cause failure
analysis related to AOI, ICT, Functional Tests, and NMR disposition; Helped
transition plan to outsource works to other companies.
08/11-12/11: Product Test Engineer at Bureau Veritas. Littleton, MA
Tested Radiated Emission and RF Immunity (ESD, CRFI, Harmonic, Flicker, EFT,
AC Surge, DIPs and Interruption) for industrial and commercial appliances
worldwide for compliance with regulator, quality and performance
requirements.
12/06-10/10: Test Engineer at Textron Defense Systems, (Secret Clearance). Wilmington, MA.
Supported test programs on Flying prober (Scorpion ), ICT (Teradyne Spectrum),
and Functional tests (TDS stations with VEE language); Collected and Analyzed
test data from ICT, and TEDs databases for defective trends, and Monthly
Operation Reviews;
Directly Responsible for a variety of manufacturing and engineering functions on
Sensor Fuzed Weapon (SFW), Small Diameter Bomb SDB), Aim-9x, MK82-84
Controllers, Brigade Combat Team Modernization Unattended Ground Sensor
(BCTM-UGS) with Vibration, Environmental Stress Screening (ESS), Hi-Pot tests,
and Preventive Maintenance Systems.
11/05-06/06: Consultant Engineer for Doble Engineering Corp. Watertown, MA.
Consulted test strategies for new PCBs Designed For Testability (DFT) with Flying
Probe, In Circuit and Functional tests. Managed outsourcing ICT programs
developed by third party vendors.
01/04-11/05: Production Support Contractor at TERADYNE, N. READING MA.
Supported production floor, Implemented ECO, Troubleshot and Debugged
Failed PCBs on Flying Probers, Z1800, Spectrum systems.
03/97-7/2003: Sr. TEST ENGINEER, STAFF ENGINEER at PACIFIC SCIENTIFIC.
Served as the head of the ICT division dealing with System services, Vendors
issues on GENRAD, TERADYNE Testers and Functional tests. Wrote Test Plans,
Developed, Maintained, and Enhanced ICT programs using advanced techniques
such as Analog Functional Test Module (AFTM), Deep Serial Memory (DSM)
boards for In System Programming (ISP/Flash) on GR2286E. Worked with
Product development team (Design/CAD/Manufacturing) to define and develop
qualification test plans.
10/95-3/97: TEST ENGINEER at LOCKHEED MARTIN COMMER. ELECTRONICS CORP.
Developed, Debugged, Implemented In circuit programs for complex Analog and
Digital PCBs using new techniques of Open Xpress, Junction Xpress, Basic Scan
on GR228X.
07/87-08/95: TEST ENGINEER at LTX CORP.
Developed, Implemented In-circuit Test programs for complex Analog and
Digital of a Mixed-Signal Tester from Prototype to final Production.
EDUCATION:
* 12/09 VEE 9.0 Programming training.
* 07/07 Teradyne Basic Programming, Preventive maintenance training for
Spectrum 8855.
* View logic/Allegro/Fabmaster Softwares/Scorpion Flying Prober.
* 02/02 Navigate Upgrade & GR228x training on Alchemist III.
* 08/01 Genrad 228X training on Advanced Programming, & PM Training.
* 4/00 Labview Basics I & II programming training with NI.
* Knowledge of Labview, Visual Basic, VEE, Unix, Dos, Windows NT, Ms. Excel.
* DVM, Amplifier, Frequency Generator, Oscilloscope, DAS, Spectrum Analyzer,
ESD Generator, Other Electrical instruments.
* Wentworth Institute of Technology. Boston, MA.
Bachelor of Science in Electronic Engineering Technology.
REFERENCE: Will be provided upon request.