Project Manager System

Fred Duewer, Ph.D

*** ***** ****** ● Albany, CA *4706 ● Home: 510-***-****

Cell: 510-***-**** ● E-Mail ********@*****.***

CAREER SUMMARY

Instrumentation scientist with 12+ years experience in instrumentation

development.

Executed major R&D projects at Xradia Inc from its foundation to becoming the

world leader in high resolution x-ray optics and imaging systems. Combined

knowledge of physical science instrumentation with engineering experience to

architect and design imaging instruments used in academic research, biomedical,

and semiconductor industries.

Managed R&D, manufacturing, and field service groups to design, build, and

deliver complex instrumentation to market on time.

Progressive increase in responsibility from individual contributor to senior

manager. Excellent interpersonal and communication skills within the company

and with customers.

CRITICAL SKILLS

Extremely strong analytical/problem-solving skills - go-to guy for difficult

problems.

Instrumentation engineering - system design, integration, and test.

Innovator with strong expertise in x-ray imaging, x-ray optics, and computed

tomography.

Broad technical experience - optics, optical design, low voltage electronic

troubleshooting, software, PLC logic, vacuum systems, servo control, safety

systems, submicron precision motion.

Experimental physics background - solid-state and x-ray.

PROFESSIONAL EXPERIENCE

2000 – 02/2009 Xradia, Inc., Concord, CA

DIRECTOR OF RESEARCH & DEVELOPMENT - 02/2006-02/2009

Fred Duewer, Ph.D 2

Improved resolution and throughput by redesigning detector assembly in Xradia’s

x-ray computed tomography product lines. Decreased total system BOM cost by

20%.

Designed large FOV (40 mm) detector assembly with high quantum efficiency for

biological/life science application - in-vivo imaging of live animals.

Led development and delivery to IBM of large FOV real-time x-ray tomography

system for semiconductor packaging application.

Provided general technical oversight for MicroXCT (micron spatial resolution x-

ray tomography system) product line. Managed a team of 4 scientists and field

service engineers.

Developed 50 nm accuracy/stability rotation stage for automatic high resolution

computed tomography.

DIRECTOR OF ENGINEERING FOR NANOXCT/MICROXCT - 03/2005-02/2006

Managed R&D, engineering, manufacturing, and field service of the company’s

two major product lines: nanoXCT (50 nm x-ray tomography system) and

MicroXCT. Led a team of 4 scientists and field service engineers. Hired,

developed and motivated staff to meet company goals.

Simplified sample preparation by developing high penetration nanoXCT to

increase usable sample thickness.

PROJECT MANAGER – NANOXCT PRODUCT LINE - 02/2002-03/2005

Led team of hardware and software engineers to develop synchrotron-based

nanoXCT system used for academic research – delivered to NSRRC in Taiwan.

Demonstrated better than 20 nm spatial resolution imaging using 3rd order

imaging.

Increased image contrast by more than 5 times by implementing Zernike phase

contrast mode for nanoXCT.

Provided application and field support for nanoXCT system delivered to Intel.

Improved focusing performance of x-ray condenser assembly by initiating

redesign of fabrication apparatus.

STAFF SCIENTIST - 2000-02/2002

Designed critical portions (including optical assembly) of Xradia’s nanoXCT

system – the world’s first 50 nm laboratory x-ray microscope – delivered to Intel

in 2001.

Removed roadblock to system function by troubleshooting and redesigning

vibration isolation of rotating anode source to improve positional stability to

better than 10 microns.

Integrated mechanical components, electrical controls, and software for nanoXCT

system.

Manufactured key optical component of nanoXCT (capillary condenser) by

creating fabrication apparatus and measurement procedure.

Demonstrated performance far exceeding customer specifications. (30% improved

spatial resolution and 25X throughput gain!)

Fred Duewer, Ph.D 3

EDUCATION

U.C. BERKELEY, Berkeley, CA

Doctor of Philosophy in Physics, 2000

Thesis: Scanned near-field microwave microscopy

Commercialized by Intematix

Wrote control software (Labview); Designed microwave sensor – used on

commercial system; Built analog feedback loop for measurement of ferroelectric

domains; Imaged samples for thesis work

CALTECH, Pasadena, CA

Bachelor of Science in Physics with honors, 1995

Fred Duewer, Ph.D 4

PUBLICATIONS AND PATENTS

1. Yalin Lu, Tao Wei, Fred Duewer, Yanqing Lu, Nai-Ben Ming, P. G. Schultz, X.-

D. Xiang, Nondestructive Imaging of Dielectric-Constant Profiles and

Ferroelectric Domains with a Scanning-Tip Microwave Near-Field Microscope,

Science 1997; 276: 2004-2006.

2. I. Takeuchi, T. Wei, Fred Duewer, Y. K. .Yoo, X.-D. Xiang V. Talyanski, S. P.

Pai, G. J. Chen, and T. Venkatsen, Low temperature scanning-tip microwave

near-field microscopy of YBCO films, Applied Physics Letters 1997; 71: 2026-

2028.

3. Chen Gao, Tao Wei, Fred Duewer, Yalin Lu, and X.-D. Xiang, High spatial

resolution quantitative microwave impedance microscopy by a scanning tip

microwave near-field microscope, Applied Physics Letters 1997; 71: 1872-1874.

4. Chen Gao, Fred Duewer, Yalin Lu, and X.-D. Xiang, Quantitative nonlinear

dielectric microscopy of periodically polarized ferroelectric domains, Applied

Physics Letters 1998; 73: 894-896.

5. Fred Duewer, C. Gao, I. Takeuchi, and X.-D. Xiang, Tip-sample distance

feedback control in a scanning evanescent microwave microscope, Applied

Physics Letters 1999; 74: 2696-2698.

6. Chen Gao, Fred Duewer, and X.-D. Xiang, Quantitative microwave evanescent

microscopy, Applied Physics Letters 1999; 75: 3005-3007.

7. Fred Duewer, C. Gao, and X.-D. Xiang, Tip-sample distance feedback control in a

scanning evanescent microwave probe for nonlinear dielectric imaging, Rev. Sci.

Instrum. 2000; 71: 2414-2417.

8. Jingwei Li, Fred Duewer, Chen Gao, Hauyee Chang, X.-D. Xiang, and Yalin Lu,

Electro-optical measurements of the ferroelectric-paralectric boundary in Ba1-

xSrxTiOy materials chips, Applied Physics Letters. 2000; 76: 769-771.

9. Young-Kook Yoo, Fred Duewer, Haitao Yang, Dong Yi, Jing-Wei Li, X.-D.

Xiang, Room-temperature electronic phase transitions in the continuous phase

diagrams of perovskite manganites, Nature 2000; 406: 704-708.

10. Gung-Chian Yin, Mau-Tsu Tang, Yen-Fang Song, Fu-Rong Chen, and K. S.

Liang, Frederick W. Duewer, and Wenbing Yun, Energy-tunable transmission x-

ray microscope for differential contrast imaging with near 60 nm resolution

tomography, Applied Physics Letters 2006, 88:2411-15.

Fred Duewer, Ph.D 5

11. Gung-Chian Yin, Yen-Fang Song, Man-Tsu Tang, Fu-Rong Chen, Keng S. Liang,

Frederick W. Duewer, Michael Feser, and Wenbing Yun, 30 nm resolution x-ray

imaging at 8 keV using third order diffraction of a zone plate lens objective in a

transmission microscope, Applied Physics Letters 2006, 89: 2211-22.

12. X.-D. Xiang, C. Gao, F. Duewer, H.-T. Yang (2006) Analytical scanning

evanescent microwave microscope and control stage, US 2006/023175 A1.

13. Wenbing Yun, David Scott, David Trapp, Fred Duewer, Yuxin Wang (2006)

High resolution direct-projection type x-ray microtomography system using

synchrotron or laboratory-based x-ray source, US 7,130,375 B1 and 7,400,704

B1.

14. Andrei Tkachuk, Hongtao Cui, Hauyee Chang, Fred Duewer, Michael Feser, S.

H. Lau, and Wenbing Yun, Multi-length scale x-ray tomography using laboratory

and synchrotron sources, Microscopy and Microanalysis 2007; 13: 1570-1571.

15. Andrei Tkachuk, Fred Duewer, Hongtao Cui, Michael Feser, Steve Wang,

Wenbing Yun, X-ray computed tomography in Zernike phase contrast mode at 8

keV with 50-nm resolution using Cu rotating anode X-ray source, Zeitschrift fur

Kristallographie 2007, 222: 650-655.

16. Wenbing Yun, Fred Duewer, Yuxin Wang (2007) X-ray microscope capillary

condenser system, US 7,170,969 B1.

17. Xianghui Zeng, Fred Duewer, Michael Feser, Carson Huang, Alan Lyon, Andrei

Tkachuk, Wenbing Yun, Ellipsoidal and parabolic glass capillaries as condensers

for x-ray microscopes, Applied Optics 2008, 47(13): 2376-81.

18. Sharon Chen, Alan Lyon, Janos Kirz, Srivatsen Seshadri, Yan Feng, Michael

Feser, Simone Sassolini, Fred Duewer, Xianghui Zeng, Carson Huang, Absolute

zone plate efficiency measurement using laboratory X-ray sources, Journal of X-

ray Science and Technology 2008, 16: 235-241.

19. Wenbing Yun, Yuxin Wang, Fred Duewer (2008) X-ray microscope with

microfocus source and Wolter condenser, US 7,406,151 B1.

20. Wenbing Yun, Fred Duewer, Michael Feser, Andrei Tkachuk, Srivatsen Seshadri

(2008) Structured anode x-ray source for X-ray microscopy, US 7,443,853

B1.

21. Yuxin Wang, Wenbing Yun, Fred Duewer (2008) Optimized x-ray energy for

high resolution imaging of integrated circuit structures, US 7,394,890 B1.

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