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Engineer Design

Location:
Rockwall, TX, 75032
Posted:
June 08, 2010

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Resume:

Present Address:

**** ***** ****

Rockwall, TX **032 Permanent Address:

**** **** ****** ****

Plano, TX 75023 CATHERINE TROGOLO

abmn8y@r.postjobfree.com

214-***-****

EDUCATION

Texas Tech University

MSEE Specializing in Semiconductor Product Engineering (PSPE),

GPA 3.423 Dec-07

Honors: Named inventor #2 on patent for work involved

during co-op

BSEE Mathematics minor, GPA

3.079 May-05

Honors: Dean's List EE Honors Fraternity Math Honors

Fraternity

STRENGTHS

Ability to learn quickly, naturally takes on leadership roles,

positive attitude, willing to accept challenges to increase knowledge,

and intense work ethic and drive

RELATED WORK EXPERIENCE

Syndiant

Aug-08-May-10

Product Engineer and Applications Engineer

- Qualified new devices SYL2010 (SVGA and WVGA), SYL2030

(WVGA), and SYL2041/61 (SVGA, WVGA, and Wide SVGA) through

IQC, ATE parametric and functional tests, and Optical

Inspection at the projector-level; analyzed, determined root

cause, and communicated design, layout, and packaging

excursions

- Initiated, developed, executed, and managed hardware tracking

(all device types, development kits, and projectors) and

customer support efforts

- Developed production optical inspect test

- Trained new employees on hardware, software, and test

- Audited packaging house and reported directly to engineers

and management improvements needed

- Deemed as the golden eye for all QC, RMA, and FA efforts;

managed all RMA and FA efforts to insure a controlled and

timely execution of actions

- Developed and executed ASIC supply current and video input

timing characterization and reported directly to design

engineers and upper-level management

- Supported Senior wafer-level Product Engineer and Senior

package-level Product Engineer through effectively analyzing

data to provide objective technical decisions

- Supported customer related issues and provided root cause and

resolution feedback to customer and internal cross functional

teams

- Supported Taiwan Field Applications Engineers, Product

Engineer, and Manager

- Company spokesperson at a convention and requested by

President to attend Projection Summit in Las Vegas with CEO,

CTO, and Senior Applications Engineer

- Supported Founders (CEO, CTO, and CFO) in market research,

customer middle-man, and engineering experiments

Texas Instruments

Jun-06-Dec-06

Co-op in DLP Group

- Presented yields to cross functional groups, multiple

Management levels, QRA, Tech Development, Design, Process,

Test, and FA engineers at daily meetings to understand

process variation driving yield loss across all major volume

products (mottling defect-appearing as random low contrast

variations in brightness)

- Development and implementation of an automated CCD camera

test (CCA) resulted in Inventor #2 on patent

- Supported xHD5 (1080p) device ramp and yield for the DLP TV

product engineering group

- Detailed failure analysis of projector screen fails through

Microscope, SEM, and interferometer scan

- Investigated projector aperture performance and proposed a

new design to accurately detect mottling yield loss

Texas Tech University

Jun-05-Jul-05

Undergraduate Research for EE Department

- Derived color timing, modified the original circuitry design,

fabricated modified design

- Reduced size and cost to fabricate

QUALIFICATIONS

Mathematics GPA 4.00

Physics GPA 3.53

Electrical Engineering GPA 3.50

Skills Excel, PowerPoint, Word, Autodesk Inventor, SpotFire,

TestWare, JMP, Mathematica, Matlab, Cadence PCB

layout, Pspice, SEM Interferometer, Microscope, and

Bench Test

MSEE Thesis

Major Contributors to the Mottling Defect in Micro

Electromechanical Projection Displays

- Developed a quantitative objective measure for the mottling

defect

- Established statistical significance in micro-mirror shape

- Established correlation between diffraction model predicted

brightness to micro-mirror shape to measured brightness

Automated CCA Test

CCA Mottling Defect Detection and Severity Identification

- Developed algorithm to quantitatively detect the mottling

defect and differentiate between severity levels

- Established correlation between CCA Mottling Grid Test to

customer/operator/CQE perception

Design Transmitter Tester for WT BEST competition

Design/Build/Test a quick test for game day

ACTIVITIES

Competitive Soccer Sting Soccer Club and PSHS Team Captain, North

Texas State Team, Olympic Developmental Team, All-

District defensive team as a sophomore

Intramural Sports Soccer, Flag Football, Softball

Peer Tutor Circuits, Physics I and II, Mathematics courses

Philanthropist American Cancer Society, Triple Play, Race for the Cure,

WT BEST mentor

Groups FCA, Tri Delta, Kappa Mu Epsilon, Eta Kappa Nu, IEEE



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