FAISAL AZAM
***** ****** ***, ************, **-**660 ■ (Cell) 512-***-**** ■ ********@*****.***
SUMMARY
A semiconductor device characterization engineer with 13 years of experience in foundry business and
extensive knowledge of physics and process. Job function is dynamic and highly demanding in nature.
PROFESSIONAL EXPERIENCE
Samsung Austin Semiconductor Austin, TX 2007 – 2013
Logic and Memory Integration – Device Engineer
Drive transfer of new Logic and Flash memory technologies to manufacturing, 32nm node and beyond
Work closely with Quality and Process teams to achieve new product qualifications
Analyze in-line, fab-out and failure analysis data to establish key relationships between processing and
device/yield/reliability impact. Improve process capability (Cp, Cpk) and performance (Pp, Ppk) metrics.
Lead cross functional development projects in order to optimize device characteristics
Write D OE for FEOL and BEOL process improvement and evaluate effect on yield, performance,
reliability of the product. Member of process change control board.
C onsult innovative ways of test optimization and early fault detection
Electrical spec ownership. Ensure compliance and provide disposition of non-conforming products.
Use H P parametric analyzer, Agilent functional tester to run standard and bench tests as needed
Par ticipate and coach at cross-department techonology forums and seminars
IBM Fishkill, NY 2000 – 2007
Electrical Characterization Engineer
Analyze chip functionality data to qualify several advanced CMOS logic and eDRAM products. Use
troubleshooting skills to drive corrective actions for manufacturing yield issues.
Track progress of the product from post tape-out through ramp up until release to production
As a member of cross unit/Alliance team, present weekly data summaries, trends, data correlations
and develop new modes of analysis as needed to delineate root cause
Establish quality control limits and metrics in order to optimize yield and performance objectives.
Issue documents and procedures on chip testing protocols. Write test instructions for Agilent testers.
Work closely with Test, Design, System Engineers, Wafer Fab, QA, FA and Manufacturing to ensure
technology meet performance, yield, variability and reliability objectives
Perform joint development work with AMD, Sony, Toshiba, Chartered to meet fabrication objectives
Digital Equipment Corporation Hudson, MA 1995 – 1996
VLSI Design Engineer (Co-op)
Member of Alpha microprocessor circuit design team
D esign I/O circuit and 64bit MUX
U tilize SPICE software in clock grid, power consumption, critical path and timing analysis
EDUCATION
Rensselaer Polytechnic Institute Troy, NY May 2000
MS Electrical Engineering. GPA: 4.0/4.0
University of Cincinnati Cincinnati, OH June 1998
BS Electrical Engineering. GPA: 3.81/4.0
PATENT: Systems and Methods for Overlay Shift Determination (# US 7,084,427 B2)
AWARD: ”Best of IBM” award recipient in 2007 for demonstrating focus & passion for work