ALAN M. HAMMOCK

**** **** ***** *.*.

Bradenton, Florida 34209

ewy41w@r.postjobfree.com

941-***-****

EXPERIENCE

SENIOR ENGINEER, Teltronics, Inc.

Sarasota, Florida; 1996 to present

• Test engineering lead supporting all production testing for Contract manufacturing, in house telecommunication and VOIP products lines.

• Selection of test equipment, test system design (PXI, GPIB, USB and RS232) and test fixture design.

• Interfacing with Design Engineering and contract customers on design for test and production issues.

• Developing incircuit (Agilent 3070), boundary scan and functional (Labview, Teststand and Basic) test programs.

• Assist Design Engineering with product debug and testing.

• Setup system/procedures to capture and log product information (configuration, licensing, revision).

• Training of production personnel on test equipment and procedures.

• Test equipment maintenance and support (VXI, Agilent 3070, GPIB, PXI)

SENIOR ENGINEER, Edwards Systems Technology

Sarasota, Florida; 1994 to 1996

• Technical group lead for Test Engineering, providing expert technical solutions to test design problems.

• Interfacing with Design Engineering and Manufacturing to insure testability of products.

• Developing incircuit/functional test and fixtures to test SMT products on HP3070 test equipment.

• Provide production support to resolve production, test and design problems.

• Selection of test equipment and test fixtures.

• System administration of HP3070 test system.

LEAD ENGINEER, Harris Corp.

Orlando, Florida; 1986 to 1994

• Technical/Project lead for test development group, developing incircuit/functional tests on HP3070 and GenRad 227x test equipment.

• Develop tests for Xilinx FPGA, PAL, PROM and EPLD devices using Acugen and Flynn Systems automatic test program generation software.

• Simulation of complex digital devices and boards to create functional tests.

• Model development for complex LSI and VLSI devices for HP3070 and GenRad 227X test systems.

• Perform testability analysis on circuit board designs while interfacing with design groups to assure a testable design.

• Program point of contact with NASA and other Harris divisions on technical issues.

• Design and development of IC modeling fixture for HP3070 and GenRad 2272 testers.

• System administration of HP3070 testers and development systems.

• Developed several C and Unix programs to support testing on the HP3070 test equipment.

• Support production testing of circuit boards, subassemblies and system integration by providing assistance troubleshooting and debugging software and hardware.

• Determination of testing guidelines, test equipment requirements, selection of test equipment and selection of software packages.

• Training of personnel on equipment and software packages.

• Additional responsibilities include development of schedules, cost data and presentation to management and customers.

TECHNICAL SUPPORT SPECIALIST, GenRad, Inc.

Maitland, Florida; 1984 to 1986

• Programming services group leader, developing incircuit test programs, functional test programs for GenRad 227X test equipment and providing technical assistance and application support.

• Model development of complex IC for GenRad 227X test equipment.

• Developed special test programs for benchmark against competitors test equipment.

• Responsibilities included providing technical assistance, application support and determining customer test equipment requirements.

SENIOR TEST ENGINEER, Westinghouse Corp.

Orlando, Florida; 1980 to 1984

• Provided technical leadership and scheduled work for the Test Engineering group.

• Development of test programs and test interfaces for Fairchild 333, GenRad 2235,GenRad 179X and custom test equipment used for board and system level testing Performed testability analysis, analyzed test data, power supply testing, burn-in and test equipment requirements.

• Interfaced with manufacturing and design groups for resolution of production, test and design problems.

TEST ENGINEER, Stromberg-Carlson

Lake Mary, Florida; 1977 to 1980

• Developed functional test programs and designed test interfaces GenRad 179X test equipment.

• Test Engineering interface with design engineering for testability requirements of product.

EDUCATION

University of Central Florida, Orlando, Florida

Bachelor of Science Engineering Technology; Summa Cum Laude; 1977

Gulf Coast Community College, Panama City, Florida

Associate of Science Engineering Technology; Cum Laude; 1975

ADDITIONAL INFORMATION

Training Courses:

National Instruments Teststand 2002, HP3070 Serial Test Language Course, 1996

HP3070 Advanced Programming Course, 1992 HP3070 Users Fundamental Course, 1992

Valid Concept and Logic Simulator Course, 1992 GenRad Performance Award, 1985

GenRad 227X Programming Course, 1984 Fairchild 333 Programming Course, 1983

Fairchild 333 LSI Programming Course, 1983

TECHNICAL SKILLS:

Software: MS OFFICE, Access and Visio, National Instruments Labview, Teststand

Operating Systems: Unix, Windows

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