Xi Liu

**** ********* **. ***. **

Lowell, MA ***51

acfh5t@r.postjobfree.com

Phone: 740-***-****

http://www.linkedin.com/in/xiliuou

EDUCATION

• Ph.D. in Industrial & Systems Engineering, Ohio University GPA: 3.9

Major Areas: Reliability Engineering, Bayesian Data Analysis, Statistical Modeling, Accelerated Life Testing

• M.S. in Industrial & Systems Engineering, Aug. 2010, Ohio University GPA: 3.8

Major Areas: Reliability Engineering, Statistical Data Analysis, Optimal Design

• B.E. in Traffic and Transportation, Jun. 2008, Beijing Jiaotong University, Beijing, China

SKILLS:

• Reliability: Reliability Prediction, Accelerated Life Testing (ALT), Life Data Analysis, Reliability Life Test Setup, Reliability Allocation, Test to Failure, System Reliability Analysis, Reliability Block Diagrams (RBD), Weibull Analysis, FMEA, Fault Tree Analysis

• Statistical Skills: Regression Analysis, Distribution Fitting, Confidence Intervals, Point Estimation,Population Modeling, Nonparametric Estimation, Sensitive Analysis, Bayesian Analysis,Survival Analysis, Dirichlet Process Mixture Models

• Quality Control: SPC, Histograms, Pareto Charts, ANOVA, Control Charts, Hypothesis Tests, Six Sigma,DMAIC process, IPO map, C&E Diagram, Gage R&R, Design of Experiments (DOE)

• Manufacturing Process: MRP, Scheduling, Kanban, Manufacturing cells, CRP

• Computer Skills: Microsoft Office, Minitab, R, WinBUGS, OPL, AutoCAD, Weibull++, Blocksim, SAS, SQL

EXPERIENCE

• Aug. – Dec. 2013, Instructor of course Engineering Economy

Department of Industrial & Systems Engineering, Ohio University, Athens, OH

- Lectured “Engineering Economy” for 46 students, 2 hours/week

- Prepared PowerPoint slides, homework, quizzes, and exams

- Evaluated students’ work and successfully fulfilled expected outcome

• Jul. – Aug. 2011, Mar. – Aug. 2012, Jul. – Aug. 2013, Visiting Scholar

Thin Film Nano & Microelectronics Research Lab, Texas A&M University, College Station, TX

- Designed and implemented accelerated life testing on new NVM devices and investigated the failure mechanism of devices

- Tested and analyzed physical and electrical properties of new NVM devices

- Investigated and demonstrated the light wavelength effects on charges trapping and transfer mechanism of new memory devices

- Conducted test to investigate the temperature effects on retention function of MOS capacitors

- Collaborated with group members to fabricate samples with sputtering machine and optimize fabrication conditions

• Sep. 2008 – Dec. 2013, Research Assistant

Department of Industrial & Systems Engineering, Ohio University, Athens, OH

- Built parametric models to design and analyze accelerated life test

- Applied DP normal mixture model to analyze the nonlinear degradation paths of Plasma Display Panels

- Developed nonparametric models to predict reliability of electronic device using accelerated life testing

RELATED COURSES

- Principles of Six Sigma Quality - Control and Reliability

- Design for Reliability - Data Mining

- Engineering Statistics - Stochastic Processes and Applications

- Theory of Statistics - Introduction to Designed Experiments

- General Physics - Circuit and Electronic Experiment

RELATED ACADEMIC PROJECTS

• Semi-parametric Bayesian Inference for Accelerated Life Test Using Dirichlet Process Mixture Model (Ph.D.Dissertation)

- Built nonparametric statistical model to predict the reliability of electronic device under ALT

• Bayesian Designing and Analysis of Simple Step-Stress Accelerated Life Test with Weibull Lifetime Distribution (Master of Science Thesis)

- Developed parametric statistical model to design accelerated life test plan, as well as to implement points and confidence intervals estimates of life time distribution

• Analyzing nonlinear degradation paths of PDPs using nonparametric Bayesian regression method

- Applied nonparametric regression model to fit nonlinear degradation paths of PDPs

• Analyzing and Increasing the Average Distance of Catapult following DMAIC Improvement Cycle (Course of Principles of Six Sigma)

- Utilized Minitab to perform six sigma tools, including IPO map, C&E Diagram, Gage R&R, control chart, etc. to improve average distance of catapult, following DMAIC Improvement Cycle

• Analysis of Change Orders for Dorms of Ohio University (Course of Quality Control and Reliability)

- Applied statistical quality control tools to examine two types of costs occurred during the renovation process of four OU dorms. The current process was defined and construction documents were analyzed to identify areas with high costs.

AWARD

• Grant from the Electronics and Photonics Division of ECS, May, 2012 & 2014

AFFILIATIONS

• Member of Institute of Industrial Engineering

• Member of Electrochemical Society

• Member of Material Research Society

PUBLICATIONS

• T. Yuan, X. Liu, S. Z. Ramadan, and Y. Kuo, “Bayesian analysis for accelerated life tests Using a Dirichlet process Weibull mixture model”, IEEE Transactions on Reliability, 63(1), Mar. 2014.

• X. Liu, Y. Kuo, and T. Yuan, “Exposure light wavelength effects on charge trapping and detrapping of nc-MoOx embedded ZrHfO high-k stack”, In Proceedings of Materials Research Society, 2013.

• X. Liu, C.H. Yang, Y. Kuo, and T. Yuan, “Memory functions of Molybdenum Oxide embedded ZrHfO high-k”, Electrochemical and Solid-State Letters, 15(6) H192-H194, 2012.

• X. Liu, C.H. Yang, Y. Kuo, and T. Yuan, “Nanocrystalline MoOx embedded ZrHfO high-k memories- charge trapping and retention characteristics”, ECS Transactions, 45(6), pp.203-209, 2012.

• T. Yuan, X. Liu, and W. Kuo, “Planning simple step-stress accelerated life tests using Bayesian methods,” IEEE Transactions on Reliability, 61(1), pp.254-263, Mar. 2011.

• T. Yuan and X. Liu, “Bayesian planning of optimal step-stress accelerated life test,” In Proceedings of the Annual Reliability and Maintainability Symposium, 2011.

PRESENTATIONS

• Light Wavelength Effects on Charge Trapping and Detrapping of AlOx Embedded ZrHfO High-k Stack

- Oral presentation; 225th ECS Meeting, Orlando, FL, May 2014

• Exposure Light Wavelength Effects on Charge Trapping and Detrapping of nc-MoOx Embedded ZrHfO High-k Stack

- Oral presentation; 2013 MRS Spring Meeting & Exhibit Guide, San Francisco, CA, April 2013

• Nonparametric Bayesian Modeling for Accelerated Life Testing

- Oral presentation; IIE Annual Conference and Expo 2012, Orlando, FL, May 2012

Contact this candidate