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Assistant Supervisor

Location:
United States
Posted:
May 23, 2014

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Resume:

V asiliy Sharikov - B a ss

*** * ******** ** *** N17 Lansing, MI, 489**-***-*** 4292 acd9ww@r.postjobfree.com

Education

University of Michigan – Ann Arbor, MI (August 2013)

M.S. in Materials Science and Engineering

Stanford University - Stanford, CA (June 2011)

B.S. in Materials Science and Engineering

Minor in Russian Language, Literature, and Culture

Experience

Characterization of Quasicrystalline GaMn film (September 2012 – June 2013)

Position: Research Assistant

Research Director: Kai Sun (acd9ww@r.postjobfree.com)

Prepared TEM sections from a larger sample using SEM-FIB

Studied the samples under a JEOL 3011 HR EM and JEOL 2100F Cs-Corrected Analytical EM

Investigated electronic properties of GaMn with AFM, MFM and EFM techniques.

The Education Program for Gifted Youth – Stanford University (June 2011 – July 2011)

Position: Residential Mentor and Physics Teaching Assistant

Managing Director: Richard Sommer (acd9ww@r.postjobfree.com)

Supervisor: Alex Jacobsen (acd9ww@r.postjobfree.com)

Assisted in instructing students in relativity and quantum mechanics

Served as residential mentor for students

Organized and conducted science-centered activities

Stanford Nanocharacterization Laboratory (October 2010 – June 2011)

Position: Equipment Trainer

Supervisor: Richard Chin (acd9ww@r.postjobfree.com)

Trained novice users of the SEM and the TEM

Proctored competency tests for trainees

Assisted in maintaining optimal function of equipment

Fabrication and Analysis of Fe-C and FePt-C Core-Shell Nanoparticles (June 2009–August 2010)

Position: Research Assistant

Research Director: Prof. Robert Sinclair (acd9ww@r.postjobfree.com)

Supervisor: Paul Kempen (acd9ww@r.postjobfree.com)

Investigated the ways the CVD technique affected nanoparticle growth

Utilized an FEI Tecnai G2 F20 X-TWIN TEM and an FEI XL30 Sirion SEM for nanoparticle

characterization

Skills

Proficient in several analytical techniques (TEM, SEM, FIB/SEM, AFM, MFM, EFM)

Experienced in working with an X-Ray Diffractometer

Experienced in ultramicrotoming, grinding/polishing, other TEM sample preparation techniques

Proficient in Mathematica

Fluent in Russian



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